Takuya Nakaue

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Micro-machining dust removing device, micro-machining apparatus, an...
- Patent number 8,062,494
- Issue date Nov 22, 2011
- National University Corporation Shizuoka University
- Futoshi Iwata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Working method using scanning probe
- Patent number 7,442,925
- Issue date Oct 28, 2008
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTOMASK DEFECT CORRECTION DEVICE AND PHOTOMASK DEFECT CORRECTION...
- Publication number 20090092905
- Publication date Apr 9, 2009
- Takuya Nakaue
- G01 - MEASURING TESTING
Information Patent Application
PHOTOMASK DEFECT CORRECTION DEVICE AND PHOTOMASK DEFECT CORRECTION...
- Publication number 20090038383
- Publication date Feb 12, 2009
- Takuya Nakaue
- G01 - MEASURING TESTING
Information Patent Application
PHOTOMASK DEFECT-SHAPE RECOGNITION APPARATUS, PHOTOMASK DEFECT-SHAP...
- Publication number 20090028420
- Publication date Jan 29, 2009
- Takuya Nakaue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Micro-machining dust removing device, micro-machining apparatus, an...
- Publication number 20080132151
- Publication date Jun 5, 2008
- National University Corporation Shizuoka University
- Futoshi Iwata
- B82 - NANO-TECHNOLOGY
Information Patent Application
Processing method using atomic force microscope microfabrication de...
- Publication number 20070278177
- Publication date Dec 6, 2007
- Kazushige Kondo
- G01 - MEASURING TESTING
Information Patent Application
Probe washing method of scanning probe microscope
- Publication number 20070131249
- Publication date Jun 14, 2007
- Takuya Nakaue
- B08 - CLEANING
Information Patent Application
Working method using scanning probe
- Publication number 20060219901
- Publication date Oct 5, 2006
- Masatoshi Yasutake
- G01 - MEASURING TESTING

Takuya Nakaue

Person

Patents Grantslast 30 patents

Micro-machining dust removing device, micro-machining apparatus, an...

Working method using scanning probe

Patents Applicationslast 30 patents

PHOTOMASK DEFECT CORRECTION DEVICE AND PHOTOMASK DEFECT CORRECTION...

PHOTOMASK DEFECT CORRECTION DEVICE AND PHOTOMASK DEFECT CORRECTION...

PHOTOMASK DEFECT-SHAPE RECOGNITION APPARATUS, PHOTOMASK DEFECT-SHAP...

Micro-machining dust removing device, micro-machining apparatus, an...

Processing method using atomic force microscope microfabrication de...

Probe washing method of scanning probe microscope

Working method using scanning probe