Tatsuki TAKAKURA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis device
- Patent number 12,188,952
- Issue date Jan 7, 2025
- HITACHI HIGH-TECH CORPORATION
- Kazuhiro Noda
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and maintenance support method
- Patent number 12,038,449
- Issue date Jul 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Marina Nakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic analyzer and analysis method
- Patent number 11,959,914
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Tatsuki Takakura
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus and method for controlling automatic a...
- Patent number 11,499,983
- Issue date Nov 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Shunichirou Nobuki
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer
- Patent number 11,486,890
- Issue date Nov 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Kenta Imai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYZER AND CONTROL METHOD OF AUTOMATIC ANALYZER
- Publication number 20240118298
- Publication date Apr 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Hitomi NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20220146540
- Publication date May 12, 2022
- Hitachi High-Tech Corporation
- Kazuhiro NODA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER AND MAINTENANCE SUPPORT METHOD
- Publication number 20210341503
- Publication date Nov 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Marina NAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL PROCESSING DEVICE AND SIGNAL PROCESSING METHOD
- Publication number 20210102964
- Publication date Apr 8, 2021
- HITACHI HIGH-TECH CORPORATION
- Makiko YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analysis Apparatus and Method for Controlling Automatic A...
- Publication number 20200319218
- Publication date Oct 8, 2020
- Hitachi High-Tech Corporation
- Shunichirou NOBUKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20200278367
- Publication date Sep 3, 2020
- Hitachi High-Technologies Corporation
- Kenta IMAI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER AND ANALYSIS METHOD
- Publication number 20200240981
- Publication date Jul 30, 2020
- HITACHI HIGH-TECH CORPORATION
- Tatsuki TAKAKURA
- G01 - MEASURING TESTING

Tatsuki TAKAKURA

Person

Patents Grantslast 30 patents

Automatic analysis device

Automatic analyzer and maintenance support method

Automatic analyzer and analysis method

Automatic analysis apparatus and method for controlling automatic a...

Automated analyzer

Patents Applicationslast 30 patents

AUTOMATIC ANALYZER AND CONTROL METHOD OF AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS DEVICE

AUTOMATIC ANALYZER AND MAINTENANCE SUPPORT METHOD

SIGNAL PROCESSING DEVICE AND SIGNAL PROCESSING METHOD

Automatic Analysis Apparatus and Method for Controlling Automatic A...

AUTOMATED ANALYZER

AUTOMATIC ANALYZER AND ANALYSIS METHOD