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Tatsuki TAKAKURA

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20250224416
    • Publication date Jul 10, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Kyohsuke Mohri
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20250189550
    • Publication date Jun 12, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi KIKUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20250116681
    • Publication date Apr 10, 2025
    • Hitachi High-Tech Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20250110142
    • Publication date Apr 3, 2025
    • Hitachi High-Tech Corporation
    • Tatsuki TAKAKURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND CONTROL METHOD OF AUTOMATIC ANALYZER
    • Publication number 20240118298
    • Publication date Apr 11, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Hitomi NISHIMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220146540
    • Publication date May 12, 2022
    • Hitachi High-Tech Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND MAINTENANCE SUPPORT METHOD
    • Publication number 20210341503
    • Publication date Nov 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Marina NAKAI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SIGNAL PROCESSING DEVICE AND SIGNAL PROCESSING METHOD
    • Publication number 20210102964
    • Publication date Apr 8, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Makiko YOSHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus and Method for Controlling Automatic A...
    • Publication number 20200319218
    • Publication date Oct 8, 2020
    • Hitachi High-Tech Corporation
    • Shunichirou NOBUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20200278367
    • Publication date Sep 3, 2020
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD
    • Publication number 20200240981
    • Publication date Jul 30, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Tatsuki TAKAKURA
    • G01 - MEASURING TESTING