Tatsumi Hirano

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmission electron microscope having electron spectrometer
- Patent number 8,436,301
- Issue date May 7, 2013
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample transfer device and sample transferring method
- Patent number 8,410,457
- Issue date Apr 2, 2013
- Hitachi, Ltd.
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder for electron microscope
- Patent number 8,338,798
- Issue date Dec 25, 2012
- Hitachi, Ltd.
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunneling junction magnetoresistive effect element and manufacturin...
- Patent number 8,284,526
- Issue date Oct 9, 2012
- Hitachi Global Storage Technologies Netherlands B.V.
- Koichi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for evaluating thin films
- Patent number 7,544,935
- Issue date Jun 9, 2009
- Hitachi, Ltd.
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Grant
Standard sample for transmission electron microscope (TEM) elementa...
- Patent number 7,053,372
- Issue date May 30, 2006
- Samsung Electronics Co., Ltd.
- Gyeong-su Park
- G01 - MEASURING TESTING
Information Patent Grant
Amorphous magnetic recording medium, process for producing the same...
- Patent number 6,699,602
- Issue date Mar 2, 2004
- Hitachi Maxell, Ltd.
- Mitsutoshi Honda
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic recording medium, a manufacturing method thereof, and a ma...
- Patent number 6,689,456
- Issue date Feb 10, 2004
- Hitachi, Ltd.
- Tetsuo Nakazawa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
NEGATIVE ELECTRODE ACTIVE MATERIAL FOR LITHIUM ION SECONDARY BATTER...
- Publication number 20150125752
- Publication date May 7, 2015
- Hitachi, Ltd
- Etsuko Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROMETER
- Publication number 20110240854
- Publication date Oct 6, 2011
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE TRANSFER DEVICE AND SAMPLE TRANSFERRING METHOD
- Publication number 20110180724
- Publication date Jul 28, 2011
- Hitachi, Ltd.
- Shohei TERADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TUNNELING JUNCTION MAGNETORESISTIVE EFFECT ELEMENT AND MANUFACTURIN...
- Publication number 20110141606
- Publication date Jun 16, 2011
- Hitachi Global Storage Technologies Netherlands B.V.
- Koichi Nishioka
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR ELECTRON MICROSCOPE
- Publication number 20100320396
- Publication date Dec 23, 2010
- Hitachi, Ltd.
- Shohei TERADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dispay unit
- Publication number 20080272685
- Publication date Nov 6, 2008
- Hitachi, Ltd.
- Mitsuharu Ikeda
- G02 - OPTICS
Information Patent Application
DIODE ELEMENT AND DISPLAY APPARATUS USING SAME AS ELECTRON SOURCE
- Publication number 20070182312
- Publication date Aug 9, 2007
- Masakazu Sagawa
- B82 - NANO-TECHNOLOGY
Information Patent Application
Glass member and production process thereof
- Publication number 20070044514
- Publication date Mar 1, 2007
- Takashi Naitou
- B32 - LAYERED PRODUCTS
Information Patent Application
Glass member
- Publication number 20070029925
- Publication date Feb 8, 2007
- Takashi Naitou
- B32 - LAYERED PRODUCTS
Information Patent Application
Image display device
- Publication number 20060284540
- Publication date Dec 21, 2006
- Toshiaki Kusunoki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Glass member
- Publication number 20060177664
- Publication date Aug 10, 2006
- Takashi Naitou
- B32 - LAYERED PRODUCTS
Information Patent Application
Method and apparatus for evaluating thin films
- Publication number 20060145075
- Publication date Jul 6, 2006
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Application
Glass member and production process thereof
- Publication number 20060063006
- Publication date Mar 23, 2006
- Takashi Naitou
- B32 - LAYERED PRODUCTS
Information Patent Application
Glass member
- Publication number 20060063009
- Publication date Mar 23, 2006
- Takashi Naitou
- B32 - LAYERED PRODUCTS
Information Patent Application
Standard sample for transmission electron microscope (TEM) elementa...
- Publication number 20050184233
- Publication date Aug 25, 2005
- Samsung Electronics Co., Ltd.
- Gyeong-su Park
- G01 - MEASURING TESTING
Information Patent Application
Amorphous magnetic recording medium, process for producing the same...
- Publication number 20020172842
- Publication date Nov 21, 2002
- Mitsutoshi Honda
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetic recording medium, a manufacturing method thereof, and a ma...
- Publication number 20020034665
- Publication date Mar 21, 2002
- Tetsuo Nakazawa
- G11 - INFORMATION STORAGE

Tatsumi Hirano

Person

Patents Grantslast 30 patents

Transmission electron microscope having electron spectrometer

Sample transfer device and sample transferring method

Sample holder for electron microscope

Tunneling junction magnetoresistive effect element and manufacturin...

Method and apparatus for evaluating thin films

Standard sample for transmission electron microscope (TEM) elementa...

Amorphous magnetic recording medium, process for producing the same...

Magnetic recording medium, a manufacturing method thereof, and a ma...

Patents Applicationslast 30 patents

NEGATIVE ELECTRODE ACTIVE MATERIAL FOR LITHIUM ION SECONDARY BATTER...

TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROMETER

SAMPLE TRANSFER DEVICE AND SAMPLE TRANSFERRING METHOD

TUNNELING JUNCTION MAGNETORESISTIVE EFFECT ELEMENT AND MANUFACTURIN...

SAMPLE HOLDER FOR ELECTRON MICROSCOPE

Dispay unit

DIODE ELEMENT AND DISPLAY APPARATUS USING SAME AS ELECTRON SOURCE

Glass member and production process thereof

Glass member

Image display device

Glass member

Method and apparatus for evaluating thin films

Glass member and production process thereof

Glass member

Standard sample for transmission electron microscope (TEM) elementa...

Amorphous magnetic recording medium, process for producing the same...

Magnetic recording medium, a manufacturing method thereof, and a ma...