Tatsuo Sugiyama

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring temperature, annealing method and method for f...
- Patent number 7,037,733
- Issue date May 2, 2006
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Temperature measuring method, heat treating method, and semiconduct...
- Publication number 20040023421
- Publication date Feb 5, 2004
- Satoshi Shibata
- G01 - MEASURING TESTING