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Tatsuya Yamada
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Version management system and version management method
Patent number
10,747,529
Issue date
Aug 18, 2020
Hitachi, Ltd.
Teruhisa Yuki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Ion implantation apparatus
Patent number
9,466,467
Issue date
Oct 11, 2016
Sumitomo Heavy Industries Ion Technology Co., Ltd.
Mitsuaki Kabasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-energy ion implanter
Patent number
9,368,327
Issue date
Jun 14, 2016
Sumitomo Heavy Industries Ion Technology Co., Ltd.
Mitsuaki Kabasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-frequency acceleration type ion acceleration and transportatio...
Patent number
8,952,340
Issue date
Feb 10, 2015
Sen Corporation
Mitsuaki Kabasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion implantation apparatus and ion implantation method
Patent number
8,759,801
Issue date
Jun 24, 2014
Sen Corporation
Shiro Ninomiya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic device test apparatus
Patent number
8,749,255
Issue date
Jun 10, 2014
Advantest Corporation
Yasuhide Takeda
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus and synchronization method
Patent number
8,700,964
Issue date
Apr 15, 2014
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus and test method
Patent number
8,502,523
Issue date
Aug 6, 2013
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus for regulating a test signal supplied to a device un...
Patent number
7,805,641
Issue date
Sep 28, 2010
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus, and electronic device
Patent number
7,743,305
Issue date
Jun 22, 2010
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Pattern generation for test apparatus and electronic device
Patent number
7,725,793
Issue date
May 25, 2010
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Instruction address generation for test apparatus and electrical de...
Patent number
7,725,794
Issue date
May 25, 2010
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus and electronic device for generating test signal to...
Patent number
7,716,541
Issue date
May 11, 2010
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus for updating a value of the bit position in result r...
Patent number
7,657,812
Issue date
Feb 2, 2010
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus and electronic device for generating test signal by...
Patent number
7,647,538
Issue date
Jan 12, 2010
Advantest Corporation
Tatsuya Yamada
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor module
Patent number
7,633,153
Issue date
Dec 15, 2009
Kabushiki Kaisha Toshiba
Kazuo Shimokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test apparatus and test method
Patent number
7,631,234
Issue date
Dec 8, 2009
Advantest Corporation
Tatsuya Yamada
G11 - INFORMATION STORAGE
Information
Patent Grant
Test apparatus and electronic device
Patent number
7,603,604
Issue date
Oct 13, 2009
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor module
Patent number
7,514,783
Issue date
Apr 7, 2009
Kabushiki Kaisha Toshiba
Kazuo Shimokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
D521952
Issue date
May 30, 2006
Kabushiki Kaisha Toshiba
Tatsuya Yamada
D13 - Equipment for production, distribution, or transformation of energy
Information
Patent Grant
Semiconductor device
Patent number
D508682
Issue date
Aug 23, 2005
Kabushiki Kaisha Toshiba
Tatsuya Yamada
D13 - Equipment for production, distribution, or transformation of energy
Information
Patent Grant
Test pattern generator, a testing device, and a method of generatin...
Patent number
6,769,083
Issue date
Jul 27, 2004
Advantest Corporation
Masaru Tsuto
G01 - MEASURING TESTING
Information
Patent Grant
Radio communication device with improved antenna duplexing apparatus
Patent number
5,768,690
Issue date
Jun 16, 1998
Kabushiki Kaisha Toshiba
Tatsuya Yamada
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Transmission power control circuit for a communication system
Patent number
5,737,697
Issue date
Apr 7, 1998
Toshiba Corporation
Tatsuya Yamada
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Power amplifier capable of saturation and linear amplification
Patent number
5,392,463
Issue date
Feb 21, 1995
Kabushiki Kaisha Toshiba
Tatsuya Yamada
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Magnetic recording medium comprising a magnetic layer having ferrom...
Patent number
5,356,726
Issue date
Oct 18, 1994
Fuji Photo Film Co., Ltd.
Yasuo Nishikawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Automatic power control apparatus
Patent number
5,303,268
Issue date
Apr 12, 1994
Kabushiki Kaisha Toshiba
Shyuitsu Tsutsumi
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20200257630
Publication date
Aug 13, 2020
Mitsubishi Electric Corporation
Tatsuya YAMADA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
VERSION MANAGEMENT SYSTEM AND VERSION MANAGEMENT METHOD
Publication number
20200225938
Publication date
Jul 16, 2020
Hitachi, Ltd
Teruhisa Yuki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROCESSING DEVICE AND COMPUTER READABLE MEDIUM
Publication number
20200050783
Publication date
Feb 13, 2020
Mitsubishi Electric Corporation
Tatsuya YAMADA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH-FREQUENCY ACCELERATION TYPE ION ACCELERATION AND TRANSPORTATIO...
Publication number
20140374617
Publication date
Dec 25, 2014
Mitsuaki Kabasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH-ENERGY ION IMPLANTER
Publication number
20140366801
Publication date
Dec 18, 2014
Mitsuaki Kabasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION IMPLANTATION APPARATUS
Publication number
20140150723
Publication date
Jun 5, 2014
SEN Corporation
Mitsuaki Kabasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION IMPLANTATION APPARATUS AND ION IMPLANTATION METHOD
Publication number
20130092825
Publication date
Apr 18, 2013
SEN Corporation
Shiro NINOMIYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRONIC DEVICE TEST APPARATUS
Publication number
20110248734
Publication date
Oct 13, 2011
Advantest Corporation
Yasuhide TAKEDA
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND TEST METHOD
Publication number
20110199133
Publication date
Aug 18, 2011
Advantest Corporation
Tatsuya YAMADA
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND SYNCHRONIZATION METHOD
Publication number
20110161763
Publication date
Jun 30, 2011
Advantest Corporation
Tatsuya YAMADA
G01 - MEASURING TESTING
Information
Patent Application
Computer System and Device Controlling Method for Computer System
Publication number
20090328038
Publication date
Dec 31, 2009
Kabushiki Kaisha Toshiba
Tatsuya Yamada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEST APPARATUS, AND ELECTRONIC DEVICE
Publication number
20080258749
Publication date
Oct 23, 2008
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND ELECTRONIC DEVICE
Publication number
20080250291
Publication date
Oct 9, 2008
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND ELECTRONIC DEVICE
Publication number
20080235539
Publication date
Sep 25, 2008
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS, AND ELECTRONIC DEVICE
Publication number
20080235548
Publication date
Sep 25, 2008
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND ELECTRONIC DEVICE
Publication number
20080235550
Publication date
Sep 25, 2008
Advantest Corporation
TATSUYA YAMADA
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND ELECTRONIC DEVICE
Publication number
20080235498
Publication date
Sep 25, 2008
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND ELECTRONIC DEVICE
Publication number
20080235549
Publication date
Sep 25, 2008
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
Test apparatus, test method, and program
Publication number
20070266290
Publication date
Nov 15, 2007
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MODULE
Publication number
20070257376
Publication date
Nov 8, 2007
Kabushiki Kaisha Toshiba
Kazuo Shimokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR MODULE
Publication number
20070257708
Publication date
Nov 8, 2007
Kabushiki Kaisha Toshiba
Kazuo Shimokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Test apparatus and test method
Publication number
20070124638
Publication date
May 31, 2007
Advantest Corporation
Tatsuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor module
Publication number
20060055432
Publication date
Mar 16, 2006
Kabushiki Kaisha Toshiba
Kazuo Shimokawa
H01 - BASIC ELECTRIC ELEMENTS