Teppei Kimura

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
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- Patent number 9,972,933
- Issue date May 15, 2018
- Japan Electronic Materials Corporation
- Teppei Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
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- Patent number 9,774,121
- Issue date Sep 26, 2017
- Japan Electronics Material Corporation
- Teppei Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card
- Patent number 7,268,568
- Issue date Sep 11, 2007
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,208,964
- Issue date Apr 24, 2007
- Nihon Denshizairyo Kabushiki Kaisha
- Atsushi Mine
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 6,980,013
- Issue date Dec 27, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumichi Machida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

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- Publication number 20170346211
- Publication date Nov 30, 2017
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Teppei Kimura
- G01 - MEASURING TESTING
Information Patent Application
Electrical Contact
- Publication number 20150280345
- Publication date Oct 1, 2015
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Teppei Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe card
- Publication number 20070052432
- Publication date Mar 8, 2007
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20050184743
- Publication date Aug 25, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Teppei Kimura
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20050151547
- Publication date Jul 14, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Application
PROBE SHEET AND PROBE SHEET UNIT USING SAME
- Publication number 20050099195
- Publication date May 12, 2005
- NIHON DENSHIZAIRYO KABUSHIKI KAISHA
- Kazumichi MACHIDA
- G01 - MEASURING TESTING
Information Patent Application
ARCH TYPE PROBE AND PROBE CARD USING SAME
- Publication number 20050099194
- Publication date May 12, 2005
- NIHON DENSHIZAIRYO KABUSHIKI KAISHA
- Atsushi MINE
- G01 - MEASURING TESTING