Teruaki Tokutomi

Person

Odawara-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,787,134
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for inspecting thermal assist type magnetic head
- Patent number 8,787,132
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Naoya Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever of scanning probe microscope and method for manufacturin...
- Patent number 8,713,710
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for magnetic force microscope and method of manufacturin...
- Patent number 8,621,659
- Issue date Dec 31, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,483,035
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic device inspection apparatus and magnetic device inspection...
- Patent number 8,359,661
- Issue date Jan 22, 2013
- Hitachi High-Technologies Corporation
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic head slider testing method
- Patent number 8,327,525
- Issue date Dec 11, 2012
- Hitachi High-Technologies Corporation
- Teruaki Tokutomi
- G11 - INFORMATION STORAGE
Information Patent Grant
Device for transporting magnetic head, device for inspecting magnet...
- Patent number 8,299,784
- Issue date Oct 30, 2012
- Hitachi High-Technologies Corporation
- Teruaki Tokutomi
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head inspection method and magnetic head inspection device
- Patent number 8,278,917
- Issue date Oct 2, 2012
- Hitachi High-Technologies Corporation
- Tsuneo Nakagomi
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head slider testing apparatus and magnetic head slider tes...
- Patent number 7,987,583
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Teruaki Tokutomi
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head slider testing apparatus and magnetic head slider tes...
- Patent number 7,355,393
- Issue date Apr 8, 2008
- Hitachi High-Technologies Corporation
- Teruaki Tokutomi
- G11 - INFORMATION STORAGE
Information Patent Grant
Polishing apparatus with abrasive tape, polishing method using abra...
- Patent number 6,893,329
- Issue date May 17, 2005
- Hitachi High-Tech Electronics Engineering Co., Ltd.
- Fujio Tajima
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus for measuring the flying height of magnetic heads using a...
- Patent number 5,757,492
- Issue date May 26, 1998
- Hitachi Electronics Engineering Co., Ltd.
- Teruaki Tokutomi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140092716
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Naoya SAITO
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140092717
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140096293
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Yoshinori KITANO
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC HEAD INSPECTION SYSTEM AND MAGNETIC HEAD INSPECTION METHOD
- Publication number 20140090117
- Publication date Mar 27, 2014
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HE...
- Publication number 20140086033
- Publication date Mar 27, 2014
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- G11 - INFORMATION STORAGE
Information Patent Application
THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...
- Publication number 20130265863
- Publication date Oct 10, 2013
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
HEAD ELEMENT INSPECTION APPARATUS
- Publication number 20130133444
- Publication date May 30, 2013
- Hitachi High-Technologies Corporation
- Yoshinori KITANO
- G01 - MEASURING TESTING
Information Patent Application
Cantilever of Scanning Probe Microscope and Method for Manufacturin...
- Publication number 20130097739
- Publication date Apr 18, 2013
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND ITS APPARATUS FOR INSPECTING A MAGNETIC HEAD DEVICE
- Publication number 20130063139
- Publication date Mar 14, 2013
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC HEAD MANUFACTURING METHOD
- Publication number 20120324720
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Tsuneo NAKAGOMI
- G11 - INFORMATION STORAGE
Information Patent Application
Thermally Assisted Magnetic Recording Head Inspection Method and Ap...
- Publication number 20120307605
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...
- Publication number 20120291161
- Publication date Nov 15, 2012
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC HEAD SLIDER TESTING APPARATUS AND MAGNETIC HEAD SLIDER TES...
- Publication number 20110116182
- Publication date May 19, 2011
- Hitachi High-Technologies Corporation
- Teruaki Tokutomi
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE FOR TRANSPORTING MAGNETIC HEAD, DEVICE FOR INSPECTING MAGNET...
- Publication number 20100327863
- Publication date Dec 30, 2010
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...
- Publication number 20100205699
- Publication date Aug 12, 2010
- Takehiro TACHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC HEAD INSPECTION METHOD, MAGNETIC HEAD INSPECTION DEVICE, A...
- Publication number 20100061002
- Publication date Mar 11, 2010
- Hitachi High-Technologies Corporation
- TSUNEO NAKAGOMI
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC HEAD SLIDER TESTING APPARATUS AND MAGNETIC HEAD SLIDER TES...
- Publication number 20080231983
- Publication date Sep 25, 2008
- Teruaki Tokutomi
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetic head slider testing apparatus and magnetic head slider tes...
- Publication number 20070013369
- Publication date Jan 18, 2007
- Teruaki Tokutomi
- G11 - INFORMATION STORAGE
Information Patent Application
Polishing apparatus with abrasive tape, polishing method using abra...
- Publication number 20040198181
- Publication date Oct 7, 2004
- Hitachi Electronics Engineering Co. Ltd.
- Fujio Tajima
- B24 - GRINDING POLISHING

Teruaki Tokutomi

Person

Patents Grantslast 30 patents

Thermally assisted magnetic recording head inspection method and ap...

Method and apparatus for inspecting thermal assist type magnetic head

Cantilever of scanning probe microscope and method for manufacturin...

Cantilever for magnetic force microscope and method of manufacturin...

Thermally assisted magnetic recording head inspection method and ap...

Magnetic device inspection apparatus and magnetic device inspection...

Magnetic head slider testing method

Device for transporting magnetic head, device for inspecting magnet...

Magnetic head inspection method and magnetic head inspection device

Magnetic head slider testing apparatus and magnetic head slider tes...

Magnetic head slider testing apparatus and magnetic head slider tes...

Polishing apparatus with abrasive tape, polishing method using abra...

Apparatus for measuring the flying height of magnetic heads using a...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

MAGNETIC HEAD INSPECTION SYSTEM AND MAGNETIC HEAD INSPECTION METHOD

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HE...

THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...

HEAD ELEMENT INSPECTION APPARATUS

Cantilever of Scanning Probe Microscope and Method for Manufacturin...

METHOD AND ITS APPARATUS FOR INSPECTING A MAGNETIC HEAD DEVICE

MAGNETIC HEAD MANUFACTURING METHOD

Thermally Assisted Magnetic Recording Head Inspection Method and Ap...

CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...

MAGNETIC HEAD SLIDER TESTING APPARATUS AND MAGNETIC HEAD SLIDER TES...

DEVICE FOR TRANSPORTING MAGNETIC HEAD, DEVICE FOR INSPECTING MAGNET...

MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...

MAGNETIC HEAD INSPECTION METHOD, MAGNETIC HEAD INSPECTION DEVICE, A...

MAGNETIC HEAD SLIDER TESTING APPARATUS AND MAGNETIC HEAD SLIDER TES...

Magnetic head slider testing apparatus and magnetic head slider tes...

Polishing apparatus with abrasive tape, polishing method using abra...