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Terumasa Morita
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Microscope apparatus
Patent number
7,817,335
Issue date
Oct 19, 2010
Olympus Corporation
Go Ryu
G02 - OPTICS
Information
Patent Grant
Light source apparatus and microscope apparatus
Patent number
7,764,424
Issue date
Jul 27, 2010
Olympus Corporation
Masato Yabe
G02 - OPTICS
Information
Patent Grant
Lens evaluation device
Patent number
7,747,101
Issue date
Jun 29, 2010
Olympus Corporation
Toshiaki Matsuzawa
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for inspecting a substrate
Patent number
6,707,546
Issue date
Mar 16, 2004
Olympus Optical Co., Ltd.
Hiroyuki Okahira
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for inspecting a substrate
Patent number
6,671,041
Issue date
Dec 30, 2003
Olympus Optical Co., Ltd.
Hiroyuki Okahira
G01 - MEASURING TESTING
Information
Patent Grant
Confocal microscope and height measurement method using the same
Patent number
6,580,518
Issue date
Jun 17, 2003
Olympus Optical Co., Ltd.
Yukio Eda
G02 - OPTICS
Information
Patent Grant
Apparatus for inspecting a substrate
Patent number
6,362,884
Issue date
Mar 26, 2002
Olympus Optical Co., Ltd.
Hiroyuki Okahira
G02 - OPTICS
Information
Patent Grant
Fine surface profile measuring apparatus
Patent number
4,971,445
Issue date
Nov 20, 1990
Olympus Optical Co., Ltd.
Eiichi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Microscope apparatus for examining wafer
Patent number
4,832,474
Issue date
May 23, 1989
Olympus Optical Co., Ltd.
Makoto Yoshinaga
G02 - OPTICS
Information
Patent Grant
Microscope
Patent number
4,744,642
Issue date
May 17, 1988
Olympus Optical Co., Ltd.
Makoto Yoshinaga
G02 - OPTICS
Information
Patent Grant
Optical surface profile measuring device
Patent number
4,732,485
Issue date
Mar 22, 1988
Olympus Optical Co., Ltd.
Terumasa Morita
G01 - MEASURING TESTING
Information
Patent Grant
Solid state image pick-up device
Patent number
4,611,221
Issue date
Sep 9, 1986
Olympus Optical Co., Ltd.
Masaharu Imai
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MEASURING HEAD AND ECCENTRICITY MEASURING DEVICE INCLUDING THE SAME
Publication number
20180017382
Publication date
Jan 18, 2018
OLYMPUS CORPORATION
Kanato ADACHI
G02 - OPTICS
Information
Patent Application
MICROSCOPE APPARATUS
Publication number
20090219614
Publication date
Sep 3, 2009
OLYMPUS CORPORATION
Go Ryu
G02 - OPTICS
Information
Patent Application
Light source apparatus and microscope apparatus
Publication number
20070274634
Publication date
Nov 29, 2007
Masato Yabe
G02 - OPTICS
Information
Patent Application
Lens evaluation device
Publication number
20070115457
Publication date
May 24, 2007
OLYMPUS CORPORATION
Toshiaki Matsuzawa
G01 - MEASURING TESTING
Information
Patent Application
Laser machining apparatus
Publication number
20060289410
Publication date
Dec 28, 2006
Terumasa Morita
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Confocal microscope and height measurement method using the same
Publication number
20020167723
Publication date
Nov 14, 2002
Olympus Optical Co., Ltd.
Yukio Eda
G02 - OPTICS
Information
Patent Application
Apparatus for inspecting a substrate
Publication number
20020057429
Publication date
May 16, 2002
Olympus Optical Co., Ltd.
Hiroyuki Okahira
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for inspecting a substrate
Publication number
20010002862
Publication date
Jun 7, 2001
Hiroyuki Okahira
G01 - MEASURING TESTING