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Terunobu Akiyama
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Neuchatel, CH
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Patents Grants
last 30 patents
Information
Patent Grant
SiC high temperature pressure transducer
Patent number
9,557,230
Issue date
Jan 31, 2017
CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA—RECHERCHE ET DEVELO...
Terunobu Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Double-side-coated surface stress sensor
Patent number
9,506,822
Issue date
Nov 29, 2016
National Institute for Materials Science
Genki Yoshikawa
G01 - MEASURING TESTING
Information
Patent Grant
Surface stress sensor
Patent number
9,212,959
Issue date
Dec 15, 2015
National Institute for Materials Science
Genki Yoshikawa
G01 - MEASURING TESTING
Information
Patent Grant
Actuating and sensing device for scanning probe microscopes
Patent number
7,051,582
Issue date
May 30, 2006
Institut de Microtechnique de l'Universite de Neuchatel
Terunobu Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Micro device and process for producing it
Patent number
6,953,751
Issue date
Oct 11, 2005
Nanoworld AG
Manfred Detterbeck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Scanning tip and process for its production and use, particularly f...
Patent number
6,767,696
Issue date
Jul 27, 2004
Nanosurf AG
Lukas Howald
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DOUBLE-SIDE-COATED SURFACE STRESS SENSOR
Publication number
20140352447
Publication date
Dec 4, 2014
NATIONAL INSTITUTE FOR MATERIALS SCIENCE
Genki Yoshikawa
G01 - MEASURING TESTING
Information
Patent Application
SiC HIGH TEMPERATURE PRESSURE TRANSDUCER
Publication number
20140238144
Publication date
Aug 28, 2014
Ecole Poyltechnique Federale de Lausanne (EPFL)
Terunobu Akiyama
G01 - MEASURING TESTING
Information
Patent Application
SURFACE STRESS SENSOR
Publication number
20130133433
Publication date
May 30, 2013
Genki Yoshikawa
G01 - MEASURING TESTING
Information
Patent Application
Micro device and process for producing it
Publication number
20040266049
Publication date
Dec 30, 2004
Manfred Detterbeck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Actuating and sensing device for scanning probe microscopes
Publication number
20040159781
Publication date
Aug 19, 2004
Terunobu Akiyama
G01 - MEASURING TESTING
Information
Patent Application
Scanning tip and process for its production and use, particularly f...
Publication number
20010050342
Publication date
Dec 13, 2001
Lukas Howald
B82 - NANO-TECHNOLOGY