Teruo KOHASHI

Person

Hachioji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 11,961,699
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 11,756,763
- Issue date Sep 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Teruo Kohashi
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic domain image processing apparatus and magnetic domain imag...
- Patent number 11,587,226
- Issue date Feb 21, 2023
- Hitachi, Ltd.
- Ryoko Araki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and method for analyzing secondary ele...
- Patent number 11,170,972
- Issue date Nov 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image acquisition system and image acquisition method
- Patent number 11,163,974
- Issue date Nov 2, 2021
- Hitachi, Ltd.
- Ryoko Araki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spin polarimeter
- Patent number 11,139,143
- Issue date Oct 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle device, charged particle irradiation method, and a...
- Patent number 10,395,885
- Issue date Aug 27, 2019
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror ion microscope and ion beam control method
- Patent number 10,304,657
- Issue date May 28, 2019
- Hitachi, Ltd.
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, optical device, irradiation method, d...
- Patent number 10,210,962
- Issue date Feb 19, 2019
- HITACHI , LTD.
- Ken Harada
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Zone plate having annular or spiral shape and Y-shaped branching ed...
- Patent number 9,864,114
- Issue date Jan 9, 2018
- Hitachi, Ltd.
- Ken Harada
- G02 - OPTICS
Information Patent Grant
Electron spin detector, and spin polarized scanning electron micros...
- Patent number 8,022,364
- Issue date Sep 20, 2011
- Hitachi, Ltd.
- Teruo Kohashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle spin polarimeter, microscope, and photoelectron sp...
- Patent number 7,985,952
- Issue date Jul 26, 2011
- Hitachi, Ltd.
- Teruo Kohashi
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope
- Patent number 7,755,046
- Issue date Jul 13, 2010
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250006454
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE
- Publication number 20240249911
- Publication date Jul 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240126061
- Publication date Apr 18, 2024
- Hitachi, Ltd
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20230274907
- Publication date Aug 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Magnetic Domain Image Processing Apparatus and Magnetic Domain Imag...
- Publication number 20220309636
- Publication date Sep 29, 2022
- Hitachi, Ltd
- Ryoko ARAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20220246393
- Publication date Aug 4, 2022
- Hitachi High-Tech Corporation
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220068593
- Publication date Mar 3, 2022
- Hitachi High-Tech Corporation
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD
- Publication number 20210192178
- Publication date Jun 24, 2021
- Hitachi, Ltd
- Ryoko ARAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPIN POLARIMETER
- Publication number 20210074509
- Publication date Mar 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR ANALYZING SECONDARY ELE...
- Publication number 20200402762
- Publication date Dec 24, 2020
- Hitachi High-Tech Corporation
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DEVICE, CHARGED PARTICLE IRRADIATION METHOD, AND A...
- Publication number 20180174795
- Publication date Jun 21, 2018
- Hitachi, Ltd
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mirror Ion Microscope and Ion Beam Control Method
- Publication number 20180025888
- Publication date Jan 25, 2018
- Hitachi, Ltd
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, OPTICAL DEVICE, IRRADIATION METHOD, D...
- Publication number 20170194065
- Publication date Jul 6, 2017
- Hitachi, Ltd
- Ken HARADA
- G02 - OPTICS
Information Patent Application
ZONE PLATE
- Publication number 20140204463
- Publication date Jul 24, 2014
- Ken Harada
- G02 - OPTICS
Information Patent Application
ELECTRON SPIN DETECTOR, AND SPIN POLARIZED SCANNING ELECTRON MICROS...
- Publication number 20100155598
- Publication date Jun 24, 2010
- Hitachi, Ltd.
- Teruo KOHASHI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE SPIN POLARIMETER, MICROSCOPE, AND PHOTOELECTRON SP...
- Publication number 20080217533
- Publication date Sep 11, 2008
- Teruo KOHASHI
- G01 - MEASURING TESTING
Information Patent Application
Transmission electron microscope
- Publication number 20080210868
- Publication date Sep 4, 2008
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN
- Publication number 20070194230
- Publication date Aug 23, 2007
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect inspection system and method for recording media
- Publication number 20070057666
- Publication date Mar 15, 2007
- Tomokazu Shimakura
- G01 - MEASURING TESTING
Information Patent Application
Magnetic recording medium, manufacturing process thereof, and magne...
- Publication number 20060093863
- Publication date May 4, 2006
- Hitachi, Ltd.
- Yuko Tsuchiya
- G11 - INFORMATION STORAGE

Teruo KOHASHI

Person

Patents Grantslast 30 patents

Charged particle beam device

Scanning electron microscope

Magnetic domain image processing apparatus and magnetic domain imag...

Scanning electron microscope and method for analyzing secondary ele...

Image acquisition system and image acquisition method

Spin polarimeter

Charged particle device, charged particle irradiation method, and a...

Mirror ion microscope and ion beam control method

Charged particle beam device, optical device, irradiation method, d...

Zone plate having annular or spiral shape and Y-shaped branching ed...

Electron spin detector, and spin polarized scanning electron micros...

Charged particle spin polarimeter, microscope, and photoelectron sp...

Transmission electron microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE

SCANNING PROBE MICROSCOPE

CHARGED PARTICLE BEAM DEVICE

Magnetic Domain Image Processing Apparatus and Magnetic Domain Imag...

SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM DEVICE

IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD

SPIN POLARIMETER

SCANNING ELECTRON MICROSCOPE AND METHOD FOR ANALYZING SECONDARY ELE...

CHARGED PARTICLE DEVICE, CHARGED PARTICLE IRRADIATION METHOD, AND A...

Mirror Ion Microscope and Ion Beam Control Method

CHARGED PARTICLE BEAM DEVICE, OPTICAL DEVICE, IRRADIATION METHOD, D...

ZONE PLATE

ELECTRON SPIN DETECTOR, AND SPIN POLARIZED SCANNING ELECTRON MICROS...

CHARGED PARTICLE SPIN POLARIMETER, MICROSCOPE, AND PHOTOELECTRON SP...

Transmission electron microscope

INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN

Defect inspection system and method for recording media

Magnetic recording medium, manufacturing process thereof, and magne...