Theodore C. Oakberg

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Forest Grove, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Measurement of waveplate retardation using a photoelastic modulator
- Patent number 6,738,137
- Issue date May 18, 2004
- Hinds Instruments, Inc.
- Theodore C. Oakberg
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence measurement
- Patent number 6,697,157
- Issue date Feb 24, 2004
- Hinds Instruments
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of waveplate retardation using a photoelastic modulator
- Patent number 6,473,181
- Issue date Oct 29, 2002
- Hinds Instruments, Inc.
- Theodore C. Oakberg
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence measurement system
- Patent number 6,473,179
- Issue date Oct 29, 2002
- Hinds Instruments, Inc.
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Elimination of modulated interference effects in photoelastic modul...
- Patent number 5,652,673
- Issue date Jul 29, 1997
- Hinds Instruments, Inc.
- Theodore C. Oakberg
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Measurement of waveplate retardation using a photoelastic modulator
- Publication number 20030030805
- Publication date Feb 13, 2003
- Theodore C. Oakberg
- G01 - MEASURING TESTING
Information Patent Application
Birefringence measurement
- Publication number 20030020911
- Publication date Jan 30, 2003
- Baoliang Wang
- G01 - MEASURING TESTING