Thijs C. Hosman

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for determining, using, and indicating ion be...
- Patent number 11,004,656
- Issue date May 11, 2021
- Gatan, Inc.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation and coating apparatus and methods
- Patent number 10,731,246
- Issue date Aug 4, 2020
- Gatan, Inc.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR SEMICONDUCTOR PACKAGE FAILURE ANALYSIS
- Publication number 20230373028
- Publication date Nov 23, 2023
- GATAN, INC.
- Steven Thomas COYLE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS AND METHOD FOR SEMICONDUCTOR PACKAGE FAILURE ANALYSIS
- Publication number 20230311244
- Publication date Oct 5, 2023
- GATAN, INC.
- Steven Thomas COYLE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Methods and Apparatus for Determining, Using, and Indicating Ion Be...
- Publication number 20160111249
- Publication date Apr 21, 2016
- GATAN, INC.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation and Coating Apparatus and Methods
- Publication number 20160024645
- Publication date Jan 28, 2016
- GATAN, INC.
- John Andrew Hunt
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...