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Tho Le La
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San Jose, CA, US
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last 30 patents
Information
Patent Grant
Methods and circuits for testing a circuit fabrication process for...
Patent number
6,507,942
Issue date
Jan 14, 2003
Xilinx , Inc.
Anthony P. Calderone
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of inspecting a semiconductor wafer for defects
Patent number
6,403,385
Issue date
Jun 11, 2002
Advanced Micro Devices, Inc.
Subramanian Venkatkrishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Interlevel dielectric thickness monitor for complex semiconductor c...
Patent number
6,350,627
Issue date
Feb 26, 2002
Advanced Micro Devices, Inc.
Tho Le La
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Doubled-sided wafer scrubbing for improved photolithography
Patent number
6,136,510
Issue date
Oct 24, 2000
Advanced Micro Devices, Inc.
Tho Le La
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Interlevel dielectric thickness monitor for complex semiconductor c...
Patent number
6,072,191
Issue date
Jun 6, 2000
Advanced Micro Devices, Inc.
Tho Le La
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Backside wafer polishing for improved photolithography
Patent number
5,780,204
Issue date
Jul 14, 1998
Advanced Micro Devices, Inc.
Tho Le La
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Defect management system for productivity and yield improvement
Patent number
5,761,064
Issue date
Jun 2, 1998
Advanced Micro Devices, Inc.
Tho Le La
G01 - MEASURING TESTING