Thomas A. Almy

Person

Tualatin, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for jitter testing an IC
- Patent number 7,627,790
- Issue date Dec 1, 2009
- Credence Systems Corporation
- Arnold M. Frisch
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring characteristics of a digital signal
- Patent number 7,409,617
- Issue date Aug 5, 2008
- Credence Systems Corporation
- Thomas Arthur Almy
- G01 - MEASURING TESTING
Information Patent Grant
Edge selecting triggering circuit
- Patent number 7,389,449
- Issue date Jun 17, 2008
- Credence Systems Corporation
- Thomas Arthur Almy
- G01 - MEASURING TESTING
Information Patent Grant
Histogram based testing of analog signals
- Patent number 5,793,642
- Issue date Aug 11, 1998
- Tektronix, Inc.
- Arnold M. Frisch
- G01 - MEASURING TESTING
Information Patent Grant
Clock controller for embedded test
- Patent number 5,673,273
- Issue date Sep 30, 1997
- Tektronix, Inc.
- Thomas A. Almy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adjustable precise delay circuit
- Patent number 5,644,261
- Issue date Jul 1, 1997
- Tektronix, Inc.
- Arnold M. Frisch
- G01 - MEASURING TESTING
Information Patent Grant
Variable reference voltage generator
- Patent number 5,576,657
- Issue date Nov 19, 1996
- Tektronix, Inc.
- Arnold M. Frisch
- G01 - MEASURING TESTING
Information Patent Grant
Timing analyzer for embedded testing
- Patent number 5,428,626
- Issue date Jun 27, 1995
- Tektronix, Inc.
- Arnold M. Frisch
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for reduction of intermodulation distortion in...
- Patent number 5,060,310
- Issue date Oct 22, 1991
- Tektronix, Inc.
- Arnold M. Frisch
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High storage capacity associative memory
- Patent number 4,670,858
- Issue date Jun 2, 1987
- Tektronix, Inc.
- Thomas A. Almy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for in effect extending the width of an associative memor...
- Patent number 4,575,818
- Issue date Mar 11, 1986
- Tektronix, Inc.
- Thomas A. Almy
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Edge selecting triggering circuit
- Publication number 20060107126
- Publication date May 18, 2006
- Thomas Arthur Almy
- G01 - MEASURING TESTING
Information Patent Application
System for measuring characteristics of a digital signal
- Publication number 20060069967
- Publication date Mar 30, 2006
- Thomas Arthur Almy
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for jitter testing an IC
- Publication number 20050097420
- Publication date May 5, 2005
- Arnold M. Frisch
- G01 - MEASURING TESTING

Thomas A. Almy

Person

Patents Grantslast 30 patents

Apparatus for jitter testing an IC

System for measuring characteristics of a digital signal

Edge selecting triggering circuit

Histogram based testing of analog signals

Clock controller for embedded test

Adjustable precise delay circuit

Variable reference voltage generator

Timing analyzer for embedded testing

Apparatus and method for reduction of intermodulation distortion in...

High storage capacity associative memory

Apparatus for in effect extending the width of an associative memor...

Patents Applicationslast 30 patents

Edge selecting triggering circuit

System for measuring characteristics of a digital signal

Apparatus for jitter testing an IC