Thomas A. Figura

Person

Nishiwaki City, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor structure formation
- Patent number 11,387,369
- Issue date Jul 12, 2022
- Micron Technology, Inc.
- Shen Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure formation
- Patent number 11,114,443
- Issue date Sep 7, 2021
- Micron Technology, Inc.
- Vivek Yadav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicided recessed silicon
- Patent number 9,076,888
- Issue date Jul 7, 2015
- Micron Technology, Inc.
- Hasan Nejad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices and structures including at least partially f...
- Patent number 8,692,305
- Issue date Apr 8, 2014
- Micron Technology, Inc.
- Brett Busch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Peripheral gate stacks and recessed array gates
- Patent number 8,252,646
- Issue date Aug 28, 2012
- Micron Technology, Inc.
- Thomas Arthur Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices and structures including at least partially f...
- Patent number 8,058,126
- Issue date Nov 15, 2011
- Micron Technology, Inc.
- Brett Busch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a transistor gate of a recessed access device, me...
- Patent number 7,977,236
- Issue date Jul 12, 2011
- Micron Technology, Inc.
- Hasan Nejad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Peripheral gate stacks and recessed array gates
- Patent number 7,939,409
- Issue date May 10, 2011
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of a plasma source to form a layer during the formation of a se...
- Patent number 7,709,343
- Issue date May 4, 2010
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double sided container capacitor for a semiconductor device
- Patent number 7,683,413
- Issue date Mar 23, 2010
- Micron Technology, Inc.
- Thomas M. Graettinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicided recessed silicon
- Patent number 7,557,032
- Issue date Jul 7, 2009
- Micron Technology, Inc.
- Hasan Nejad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of a plasma source to form a layer during the formation of a se...
- Patent number 7,429,535
- Issue date Sep 30, 2008
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming openings into dielectric material
- Patent number 7,419,913
- Issue date Sep 2, 2008
- Micron Technology, Inc.
- Thomas M. Graettinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Peripheral gate stacks and recessed array gates
- Patent number 7,416,943
- Issue date Aug 26, 2008
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of a plasma source to form a layer during the formation of a se...
- Patent number 7,294,578
- Issue date Nov 13, 2007
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic random access memory circuitry and integrated circuitry
- Patent number 7,285,814
- Issue date Oct 23, 2007
- Micron Technology, Inc.
- John M. Drynan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming devices associated with semiconductor constructions
- Patent number 7,214,621
- Issue date May 8, 2007
- Micron Technology, Inc.
- Hasan Nejad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double sided container capacitor for a semiconductor device and met...
- Patent number 7,105,403
- Issue date Sep 12, 2006
- Micron Technology, Inc.
- Thomas M. Graettinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic random access memory circuitry comprising insulative collars
- Patent number 7,019,347
- Issue date Mar 28, 2006
- Micron Technology, Inc.
- John M. Drynan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for improved alignment tolerance in multiple, singularize...
- Patent number 6,897,529
- Issue date May 24, 2005
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuitry comprising insulative collars and integrated c...
- Patent number 6,861,713
- Issue date Mar 1, 2005
- Micron Technology, Inc.
- John M. Drynan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for improved alignment tolerance in multiple,...
- Patent number 6,727,538
- Issue date Apr 27, 2004
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of a plasma source to form a layer during the formation of a se...
- Patent number 6,716,769
- Issue date Apr 6, 2004
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhancing semiconductor structure surface area using HSG and etching
- Patent number 6,667,218
- Issue date Dec 23, 2003
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of alloying a semiconductor device
- Patent number 6,664,171
- Issue date Dec 16, 2003
- Micron Technology, Inc.
- Fernando Gonzalez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming conductive contacts to conductive structures
- Patent number 6,645,846
- Issue date Nov 11, 2003
- Micron Technology, Inc.
- John M. Drynan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective method to form roughened silicon
- Patent number 6,607,966
- Issue date Aug 19, 2003
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing methods of forming a capacitor, and capacitor construction
- Patent number 6,580,114
- Issue date Jun 17, 2003
- Micron Technology, Inc.
- Thomas M. Graettinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing tapered opening using an anisotropic etch...
- Patent number 6,524,875
- Issue date Feb 25, 2003
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Doped silicon structure with impression image on opposing roughened...
- Patent number 6,507,065
- Issue date Jan 14, 2003
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MICROELECTRONIC DEVICES INCLUDING MEMORY CELL STRUCTURES, AND RELAT...
- Publication number 20220375942
- Publication date Nov 24, 2022
- Micron Technology, Inc.
- Stephen D. Snyder
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STRUCTURE FORMATION
- Publication number 20210193843
- Publication date Jun 24, 2021
- Micron Technology, Inc.
- Shen Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE FORMATION
- Publication number 20210066307
- Publication date Mar 4, 2021
- Micron Technology, Inc.
- Vivek Yadav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND STRUCTURES INCLUDING AT LEAST PARTIALLY F...
- Publication number 20120043596
- Publication date Feb 23, 2012
- Micron Technology, Inc.
- Brett Busch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Peripheral Gate Stacks and Recessed Array Gates
- Publication number 20110183507
- Publication date Jul 28, 2011
- Micron Technology Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND STRUCTURES INCLUDING AT LEAST PARTIALLY F...
- Publication number 20100193853
- Publication date Aug 5, 2010
- Micron Technology, Inc.
- Brett Busch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method Of Forming A Transistor Gate Of A Recessed Access Device, Me...
- Publication number 20090239366
- Publication date Sep 24, 2009
- Hasan Nejad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USE OF A PLASMA SOURCE TO FORM A LAYER DURING THE FORMATION OF A SE...
- Publication number 20090017634
- Publication date Jan 15, 2009
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Peripheral Gate Stacks and Recessed Array Gates
- Publication number 20080299753
- Publication date Dec 4, 2008
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Use of a plasma source to form a layer during the formation of a se...
- Publication number 20070123048
- Publication date May 31, 2007
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICIDED RECESSED SILICON
- Publication number 20070105357
- Publication date May 10, 2007
- Micron Technology, Inc.
- Hasan Nejad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Peripheral gate stacks and recessed array gates
- Publication number 20070048930
- Publication date Mar 1, 2007
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming openings into dielectric material
- Publication number 20070049037
- Publication date Mar 1, 2007
- Micron Technology, Inc.
- Thomas M. Graettinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Silicided recessed silicon
- Publication number 20070049015
- Publication date Mar 1, 2007
- Hasan Nejad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Double sided container capacitor for a semiconductor device and met...
- Publication number 20070001207
- Publication date Jan 4, 2007
- Thomas M. Graettinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming devices associated with semiconductor constructions
- Publication number 20060263979
- Publication date Nov 23, 2006
- Hasan Nejad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic random assess memory circuitry and integrated circuitry
- Publication number 20060157767
- Publication date Jul 20, 2006
- John M. Drynan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic random access memory circuitry comprising insulative collars
- Publication number 20050124163
- Publication date Jun 9, 2005
- John M. Drynan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Double sided container capacitor for a semiconductor device and met...
- Publication number 20050026361
- Publication date Feb 3, 2005
- Thomas M. Graettinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of alloying a semiconductor device
- Publication number 20030173565
- Publication date Sep 18, 2003
- Micron Technology, Inc.
- Fernando Gonzalez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming conductive contacts to conductive structures
- Publication number 20030074787
- Publication date Apr 24, 2003
- John M. Drynan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of alloying a semiconductor device
- Publication number 20030077913
- Publication date Apr 24, 2003
- Micron Technology, Inc.
- Fernando Gonzalez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming conductive contacts to conductive structures, an...
- Publication number 20030075799
- Publication date Apr 24, 2003
- John M. Drynan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING TAPERED OPENINGS USING AN ANISOTROPIC ETCH...
- Publication number 20030017638
- Publication date Jan 23, 2003
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Material removal method for forming a structure
- Publication number 20020187648
- Publication date Dec 12, 2002
- Zhiqiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Selective method to form roughened silicon
- Publication number 20020058392
- Publication date May 16, 2002
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for improved alignment tolerance in multiple,...
- Publication number 20020038875
- Publication date Apr 4, 2002
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for improved alignment tolerance in multiple,...
- Publication number 20020036302
- Publication date Mar 28, 2002
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Doped silicon structure with impression image on opposing roughened...
- Publication number 20010038116
- Publication date Nov 8, 2001
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCING SEMICONDUCTOR STRUCTURE SURFACE AREA USING HSG AND ETCHING
- Publication number 20010001730
- Publication date May 24, 2001
- THOMAS A FIGURA
- H01 - BASIC ELECTRIC ELEMENTS

Thomas A. Figura

Person

Patents Grantslast 30 patents

Semiconductor structure formation

Semiconductor structure formation

Silicided recessed silicon

Semiconductor devices and structures including at least partially f...

Peripheral gate stacks and recessed array gates

Semiconductor devices and structures including at least partially f...

Method of forming a transistor gate of a recessed access device, me...

Peripheral gate stacks and recessed array gates

Use of a plasma source to form a layer during the formation of a se...

Double sided container capacitor for a semiconductor device

Silicided recessed silicon

Use of a plasma source to form a layer during the formation of a se...

Methods of forming openings into dielectric material

Peripheral gate stacks and recessed array gates

Use of a plasma source to form a layer during the formation of a se...

Dynamic random access memory circuitry and integrated circuitry

Methods of forming devices associated with semiconductor constructions

Double sided container capacitor for a semiconductor device and met...

Dynamic random access memory circuitry comprising insulative collars

Structure for improved alignment tolerance in multiple, singularize...

Integrated circuitry comprising insulative collars and integrated c...

Method and structure for improved alignment tolerance in multiple,...

Use of a plasma source to form a layer during the formation of a se...

Enhancing semiconductor structure surface area using HSG and etching

Method of alloying a semiconductor device

Methods of forming conductive contacts to conductive structures

Selective method to form roughened silicon

Processing methods of forming a capacitor, and capacitor construction

Method for manufacturing tapered opening using an anisotropic etch...

Doped silicon structure with impression image on opposing roughened...

Patents Applicationslast 30 patents

MICROELECTRONIC DEVICES INCLUDING MEMORY CELL STRUCTURES, AND RELAT...

SEMICONDUCTOR STRUCTURE FORMATION

SEMICONDUCTOR STRUCTURE FORMATION

SEMICONDUCTOR DEVICES AND STRUCTURES INCLUDING AT LEAST PARTIALLY F...

Peripheral Gate Stacks and Recessed Array Gates

SEMICONDUCTOR DEVICES AND STRUCTURES INCLUDING AT LEAST PARTIALLY F...

Method Of Forming A Transistor Gate Of A Recessed Access Device, Me...

USE OF A PLASMA SOURCE TO FORM A LAYER DURING THE FORMATION OF A SE...

Peripheral Gate Stacks and Recessed Array Gates

Use of a plasma source to form a layer during the formation of a se...

SILICIDED RECESSED SILICON

Peripheral gate stacks and recessed array gates

Methods of forming openings into dielectric material

Silicided recessed silicon

Double sided container capacitor for a semiconductor device and met...

Methods of forming devices associated with semiconductor constructions

Dynamic random assess memory circuitry and integrated circuitry

Dynamic random access memory circuitry comprising insulative collars

Double sided container capacitor for a semiconductor device and met...

Method of alloying a semiconductor device

Methods of forming conductive contacts to conductive structures

Method of alloying a semiconductor device

Methods of forming conductive contacts to conductive structures, an...

METHOD FOR MANUFACTURING TAPERED OPENINGS USING AN ANISOTROPIC ETCH...

Material removal method for forming a structure

Selective method to form roughened silicon

Method and structure for improved alignment tolerance in multiple,...

Method and structure for improved alignment tolerance in multiple,...

Doped silicon structure with impression image on opposing roughened...

ENHANCING SEMICONDUCTOR STRUCTURE SURFACE AREA USING HSG AND ETCHING