Thomas G. Miller

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Artificial intelligence-enabled preparation end-pointing
- Patent number 11,847,813
- Issue date Dec 19, 2023
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of material deposition
- Patent number 11,798,804
- Issue date Oct 24, 2023
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...
- Patent number 11,313,042
- Issue date Apr 26, 2022
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Artificial intelligence-enabled preparation end-pointing
- Patent number 11,176,656
- Issue date Nov 16, 2021
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of material deposition
- Patent number 11,069,523
- Issue date Jul 20, 2021
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,825,651
- Issue date Nov 3, 2020
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for semiconductor sample workflow
- Patent number 10,707,137
- Issue date Jul 7, 2020
- FEI Company
- Konstantin Balashov
- G01 - MEASURING TESTING
Information Patent Grant
Dose-based end-pointing for low-kV FIB milling TEM sample preparation
- Patent number 10,465,293
- Issue date Nov 5, 2019
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Defect analysis
- Patent number 10,373,881
- Issue date Aug 6, 2019
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
High aspect ratio X-ray targets and uses of same
- Patent number 10,366,860
- Issue date Jul 30, 2019
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,340,119
- Issue date Jul 2, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for semiconductor sample workflow
- Patent number 10,312,162
- Issue date Jun 4, 2019
- FEI Company
- Konstantin Balashov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for rapid switching between a high current mode and a low cu...
- Patent number 10,176,969
- Issue date Jan 8, 2019
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of material deposition
- Patent number 9,978,586
- Issue date May 22, 2018
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
High aspect ratio x-ray targets and uses of same
- Patent number 9,934,930
- Issue date Apr 3, 2018
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Internal split faraday shield for a plasma source
- Patent number 9,818,584
- Issue date Nov 14, 2017
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging and processing for plasma ion source
- Patent number 9,691,583
- Issue date Jun 27, 2017
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated TEM sample preparation
- Patent number 9,601,313
- Issue date Mar 21, 2017
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for rapid switching between a high current mode and a low cu...
- Patent number 9,257,261
- Issue date Feb 9, 2016
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated ion beam idle
- Patent number 9,123,500
- Issue date Sep 1, 2015
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging and processing for plasma ion source
- Patent number 9,105,438
- Issue date Aug 11, 2015
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple image metrology
- Patent number 9,046,344
- Issue date Jun 2, 2015
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
System and method for ex situ analysis of a substrate
- Patent number 8,884,247
- Issue date Nov 11, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Multiple image metrology
- Patent number 8,779,357
- Issue date Jul 15, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method of preparing and imaging a lamella in a particle-optical app...
- Patent number 8,766,214
- Issue date Jul 1, 2014
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma igniter for an inductively coupled plasma ion source
- Patent number 8,723,143
- Issue date May 13, 2014
- FEI Company
- Anthony Graupera
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pattern modification schemes for improved FIB patterning
- Patent number 8,624,206
- Issue date Jan 7, 2014
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system having multiple user-selectable operat...
- Patent number 8,445,870
- Issue date May 21, 2013
- FEI Company
- Shouyin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern modification schemes for improved FIB patterning
- Patent number 8,314,409
- Issue date Nov 20, 2012
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system having multiple user-selectable operat...
- Patent number 8,253,118
- Issue date Aug 28, 2012
- FEI Company
- Shouyin Zhang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20240071040
- Publication date Feb 29, 2024
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROSCOPY FEEDBACK FOR IMPROVED MILLING ACCURACY
- Publication number 20230197403
- Publication date Jun 22, 2023
- FEI Company
- Thomas Gary Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Artificial Intelligence Enabled Metrology
- Publication number 20230034667
- Publication date Feb 2, 2023
- FEI Company
- John FLANAGAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20220067915
- Publication date Mar 3, 2022
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MATERIAL DEPOSITION
- Publication number 20210118678
- Publication date Apr 22, 2021
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSE ESTIMATION USING SEMATIC SEGMENTATION
- Publication number 20210088770
- Publication date Mar 25, 2021
- FEI Company
- John FLANAGAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20200279362
- Publication date Sep 3, 2020
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Artificial Intelligence Enabled Metrology
- Publication number 20200134829
- Publication date Apr 30, 2020
- FEI Company
- John FLANAGAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DOSE-BASED END-POINTING FOR LOW-KV FIB MILLING IN TEM SAMPLE PREPAR...
- Publication number 20200095688
- Publication date Mar 26, 2020
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS AND APPARATUS FOR SEMICONDUCTOR SAMPLE WORKFLOW
- Publication number 20190355627
- Publication date Nov 21, 2019
- FEI Company
- Konstantin BALASHOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20190272975
- Publication date Sep 5, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MATERIAL DEPOSITION
- Publication number 20180277361
- Publication date Sep 27, 2018
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Application
HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME
- Publication number 20180190467
- Publication date Jul 5, 2018
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Defect Analysis
- Publication number 20180182676
- Publication date Jun 28, 2018
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR SEMICONDUCTOR SAMPLE WORKFLOW
- Publication number 20170363549
- Publication date Dec 21, 2017
- FEI Company
- Konstantin Balashov
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20170256380
- Publication date Sep 7, 2017
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MATERIAL DEPOSITION
- Publication number 20170133220
- Publication date May 11, 2017
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR RAPID SWITCHING BETWEEN A HIGH CURRENT MODE AND A LOW CU...
- Publication number 20160233053
- Publication date Aug 11, 2016
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20160141147
- Publication date May 19, 2016
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING AND PROCESSING FOR PLASMA ION SOURCE
- Publication number 20150380204
- Publication date Dec 31, 2015
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME
- Publication number 20150303021
- Publication date Oct 22, 2015
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
INTERNAL SPLIT FARADAY SHIELD FOR AN INDUCTIVELY COUPLED PLASMA SOURCE
- Publication number 20150008213
- Publication date Jan 8, 2015
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE IMAGE METROLOGY
- Publication number 20140319344
- Publication date Oct 30, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Ex Situ Analysis of a Substrate
- Publication number 20140084157
- Publication date Mar 27, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Application
Dose-Based End-Pointing for Low-KV FIB Milling TEM Sample Preparation
- Publication number 20140061032
- Publication date Mar 6, 2014
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...
- Publication number 20140007307
- Publication date Jan 2, 2014
- Brian Roberts Routh
- B82 - NANO-TECHNOLOGY
Information Patent Application
IMAGING AND PROCESSING FOR PLASMA ION SOURCE
- Publication number 20130320229
- Publication date Dec 5, 2013
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Ion Beam Idle
- Publication number 20130256553
- Publication date Oct 3, 2013
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Internal Split Faraday Shield for an Inductively Coupled Plasma Source
- Publication number 20130098871
- Publication date Apr 25, 2013
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Modification Schemes for Improved FIB Patterning
- Publication number 20130092826
- Publication date Apr 18, 2013
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS

Thomas G. Miller

Person

Patents Grantslast 30 patents

Artificial intelligence-enabled preparation end-pointing

Method of material deposition

Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...

Artificial intelligence-enabled preparation end-pointing

Method of material deposition

Automated TEM sample preparation

Methods and apparatus for semiconductor sample workflow

Dose-based end-pointing for low-kV FIB milling TEM sample preparation

Defect analysis

High aspect ratio X-ray targets and uses of same

Automated TEM sample preparation

Methods and apparatus for semiconductor sample workflow

Method for rapid switching between a high current mode and a low cu...

Method of material deposition

High aspect ratio x-ray targets and uses of same

Internal split faraday shield for a plasma source

Imaging and processing for plasma ion source

Automated TEM sample preparation

Method for rapid switching between a high current mode and a low cu...

Automated ion beam idle

Imaging and processing for plasma ion source

Multiple image metrology

System and method for ex situ analysis of a substrate

Multiple image metrology

Method of preparing and imaging a lamella in a particle-optical app...

Plasma igniter for an inductively coupled plasma ion source

Pattern modification schemes for improved FIB patterning

Charged particle beam system having multiple user-selectable operat...

Pattern modification schemes for improved FIB patterning

Charged particle beam system having multiple user-selectable operat...

Patents Applicationslast 30 patents

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

MICROSCOPY FEEDBACK FOR IMPROVED MILLING ACCURACY

Artificial Intelligence Enabled Metrology

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

METHOD OF MATERIAL DEPOSITION

POSE ESTIMATION USING SEMATIC SEGMENTATION

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

Artificial Intelligence Enabled Metrology

DOSE-BASED END-POINTING FOR LOW-KV FIB MILLING IN TEM SAMPLE PREPAR...

METHODS AND APPARATUS FOR SEMICONDUCTOR SAMPLE WORKFLOW

AUTOMATED TEM SAMPLE PREPARATION

METHOD OF MATERIAL DEPOSITION

HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME

Defect Analysis

METHODS AND APPARATUS FOR SEMICONDUCTOR SAMPLE WORKFLOW

AUTOMATED TEM SAMPLE PREPARATION

METHOD OF MATERIAL DEPOSITION

METHOD FOR RAPID SWITCHING BETWEEN A HIGH CURRENT MODE AND A LOW CU...

AUTOMATED TEM SAMPLE PREPARATION

IMAGING AND PROCESSING FOR PLASMA ION SOURCE

HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME

INTERNAL SPLIT FARADAY SHIELD FOR AN INDUCTIVELY COUPLED PLASMA SOURCE

MULTIPLE IMAGE METROLOGY

System and Method for Ex Situ Analysis of a Substrate

Dose-Based End-Pointing for Low-KV FIB Milling TEM Sample Preparation

METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...

IMAGING AND PROCESSING FOR PLASMA ION SOURCE

Automated Ion Beam Idle

Internal Split Faraday Shield for an Inductively Coupled Plasma Source

Pattern Modification Schemes for Improved FIB Patterning