Thomas Hantschel

Person

Houtvenne, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer configured to recondition a support surface of a wafer holdin...
- Patent number 11,955,368
- Issue date Apr 9, 2024
- Imec VZW
- Thomas Hantschel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Offcut angle determination using electron channeling patterns
- Patent number 11,650,171
- Issue date May 16, 2023
- FEI Company
- Han Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and tip substrate for scanning probe microscopy
- Patent number 11,112,427
- Issue date Sep 7, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe suitable for scanning probe microscopy
- Patent number 11,035,880
- Issue date Jun 15, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Probe configuration and method of fabrication thereof
- Patent number 9,612,258
- Issue date Apr 4, 2017
- IMEC
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tunnel field-effect transistor and methods for manufacturing thereof
- Patent number 8,872,230
- Issue date Oct 28, 2014
- IMEC
- Anne S. Verhulst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cost-efficient manufacturing diamond tips for ultra-high...
- Patent number 8,484,761
- Issue date Jul 9, 2013
- IMEC
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Method for Producing a Substrate Comprising Multiple Tips for Scann...
- Publication number 20240175896
- Publication date May 30, 2024
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
OFFCUT ANGLE DETERMINATION USING ELECTRON CHANNELING PATTERNS
- Publication number 20220412900
- Publication date Dec 29, 2022
- FEI Company
- Han Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210116476
- Publication date Apr 22, 2021
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
WAFER CONFIGURED TO RECONDITION A SUPPORT SURFACE OF A WAFER HOLDIN...
- Publication number 20210020494
- Publication date Jan 21, 2021
- IMEC vzw
- Thomas Hantschel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing a Probe Suitable for Scanning Probe Microscopy
- Publication number 20200278379
- Publication date Sep 3, 2020
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
PROBE CONFIGURATION AND METHOD OF FABRICATION THEREOF
- Publication number 20150185249
- Publication date Jul 2, 2015
- IMEC
- Thomas HANTSCHEL
- G01 - MEASURING TESTING
Information Patent Application
TUNNEL FIELD-EFFECT TRANSISTOR AND METHODS FOR MANUFACTURING THEREOF
- Publication number 20130161696
- Publication date Jun 27, 2013
- IMEC
- Anne S. Verhulst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR COST-EFFICIENT MANUFACTURING DIAMOND TIPS FOR ULTRA-HIGH...
- Publication number 20090313730
- Publication date Dec 17, 2009
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Thomas Hantschel
- G01 - MEASURING TESTING

Thomas Hantschel

Person

Patents Grantslast 30 patents

Wafer configured to recondition a support surface of a wafer holdin...

Offcut angle determination using electron channeling patterns

Method and tip substrate for scanning probe microscopy

Method for producing a probe suitable for scanning probe microscopy

Probe configuration and method of fabrication thereof

Tunnel field-effect transistor and methods for manufacturing thereof

Method for cost-efficient manufacturing diamond tips for ultra-high...

Patents Applicationslast 30 patents

Method for Producing a Substrate Comprising Multiple Tips for Scann...

OFFCUT ANGLE DETERMINATION USING ELECTRON CHANNELING PATTERNS

METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY

WAFER CONFIGURED TO RECONDITION A SUPPORT SURFACE OF A WAFER HOLDIN...

Method for Producing a Probe Suitable for Scanning Probe Microscopy

PROBE CONFIGURATION AND METHOD OF FABRICATION THEREOF

TUNNEL FIELD-EFFECT TRANSISTOR AND METHODS FOR MANUFACTURING THEREOF

METHOD FOR COST-EFFICIENT MANUFACTURING DIAMOND TIPS FOR ULTRA-HIGH...