Thomas Kaltenbach

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Gutach-Siegelau, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for the automatic parameterization of measuring systems
- Patent number 7,602,505
- Issue date Oct 13, 2009
- Sick AG
- Thomas Kaltenbach
- G01 - MEASURING TESTING
Information Patent Grant
Scanning method and scanning apparatus
- Patent number 7,579,582
- Issue date Aug 25, 2009
- Sick AG
- Thomas Kaltenbach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and an apparatus for the detection of objects moved on a con...
- Patent number 7,199,385
- Issue date Apr 3, 2007
- Sick AG
- Klemens Wehrle
- G01 - MEASURING TESTING
Information Patent Grant
Method for locating articles on a support plane
- Patent number 6,847,859
- Issue date Jan 25, 2005
- Sick AG
- Achim Nuebling
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR THE ANONYMIZED IMAGE ACQUISITION IN AN IND...
- Publication number 20230367904
- Publication date Nov 16, 2023
- SICK AG
- Klemens WEHRLE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning method and scanning apparatus
- Publication number 20070252078
- Publication date Nov 1, 2007
- Thomas Kaltenbach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for the automatic parameterization of measuring systems
- Publication number 20070121122
- Publication date May 31, 2007
- Thomas Kaltenbach
- G01 - MEASURING TESTING
Information Patent Application
Method and an apparatus for the detection of objects moved on a con...
- Publication number 20040144934
- Publication date Jul 29, 2004
- Klemens Wehrle
- G01 - MEASURING TESTING
Information Patent Application
Method for locating articles on a support plane
- Publication number 20030233166
- Publication date Dec 18, 2003
- SICK AG
- Achim Nuebling
- G01 - MEASURING TESTING