Thomas S. Barnett

Person

Jericho, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods, apparatus, and program products to optimize semiconductor...
- Patent number 7,917,451
- Issue date Mar 29, 2011
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Equivalent gate count yield estimation for integrated circuit devices
- Patent number 7,477,961
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for determining minimum post production test time...
- Patent number 7,139,944
- Issue date Nov 21, 2006
- International Business Machines Corporation
- Tange Nan Barbour
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of statistical binning for reliability selection
- Patent number 6,789,032
- Issue date Sep 7, 2004
- International Business Machines Corporation
- Tange N. Barbour
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS, APPARATUS, AND PROGRAM PRODUCTS TO OPTIMIZE SEMICONDUCTOR...
- Publication number 20090234777
- Publication date Sep 17, 2009
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20090112352
- Publication date Apr 30, 2009
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR IMPROVED EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTE...
- Publication number 20070265722
- Publication date Nov 15, 2007
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING MINIMUM POST PRODUCTION TEST TIME...
- Publication number 20050049810
- Publication date Mar 3, 2005
- International Business Machines Corporation
- Tange Nan Barbour
- G11 - INFORMATION STORAGE
Information Patent Application
Method for burn-in testing
- Publication number 20030151422
- Publication date Aug 14, 2003
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of statistical binning for reliability selection
- Publication number 20030120445
- Publication date Jun 26, 2003
- International Business Machines Corporation
- Tange N. Barbour
- G06 - COMPUTING CALCULATING COUNTING

Thomas S. Barnett

Person

Patents Grantslast 30 patents

Methods, apparatus, and program products to optimize semiconductor...

Equivalent gate count yield estimation for integrated circuit devices

Method and system for determining minimum post production test time...

Method of statistical binning for reliability selection

Patents Applicationslast 30 patents

METHODS, APPARATUS, AND PROGRAM PRODUCTS TO OPTIMIZE SEMICONDUCTOR...

EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES

METHOD FOR IMPROVED EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTE...

METHOD AND SYSTEM FOR DETERMINING MINIMUM POST PRODUCTION TEST TIME...

Method for burn-in testing

Method of statistical binning for reliability selection