Thomas Schmid

Person

Aalen, DE

People

Patents Applicationslast 30 patents

Information Patent Application
MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ANISOTROPIC FILT...
- Publication number 20250239429
- Publication date Jul 24, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk ZEIDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MIC...
- Publication number 20250210300
- Publication date Jun 26, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk ZEIDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH MIRROR FOR FIELD...
- Publication number 20250132124
- Publication date Apr 24, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE BEAM SYSTEM
- Publication number 20240234080
- Publication date Jul 11, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM GENERATING UNIT WITH INCREASED FOCUSING POWER
- Publication number 20240170252
- Publication date May 23, 2024
- Carl Zeiss MultiSEM GmbH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE BEAM SYSTEM
- Publication number 20240136146
- Publication date Apr 25, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISTORTION OPTIMIZED MULTI-BEAM SCANNING SYSTEM
- Publication number 20240096587
- Publication date Mar 21, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST A...
- Publication number 20230245852
- Publication date Aug 3, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS

Thomas Schmid

Person

Patents Applicationslast 30 patents

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ANISOTROPIC FILT...

PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MIC...

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH MIRROR FOR FIELD...

MULTI-BEAM PARTICLE BEAM SYSTEM

MULTI-BEAM GENERATING UNIT WITH INCREASED FOCUSING POWER

MULTI-BEAM PARTICLE BEAM SYSTEM

DISTORTION OPTIMIZED MULTI-BEAM SCANNING SYSTEM

MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST A...