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Timothy J. Charest
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West Hurley, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
SRAM and dual single ended bit sense for an SRAM
Patent number
7,170,799
Issue date
Jan 30, 2007
International Business Machines Corporation
Yuen H. Chan
G11 - INFORMATION STORAGE
Information
Patent Grant
Cache late select circuit
Patent number
7,054,184
Issue date
May 30, 2006
International Business Machines Corporation
Yuen H. Chan
G11 - INFORMATION STORAGE
Information
Patent Grant
Clock driver and boundary latch for a multi-port SRAM
Patent number
6,990,038
Issue date
Jan 24, 2006
International Business Machines Corp.
Yuen H. Chan
G11 - INFORMATION STORAGE
Information
Patent Grant
Programmable sense amplifier timing generator
Patent number
6,958,943
Issue date
Oct 25, 2005
International Business Machines Corporation
Yuen H. Chan
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for facilitating random pattern testing of log...
Patent number
6,836,865
Issue date
Dec 28, 2004
International Business Machines Corporation
Mary P. Kusko
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Cycle staging latch with dual phase dynamic outputs for hit logic c...
Publication number
20060176095
Publication date
Aug 10, 2006
International Business Machines Corporation
Yuen H. Chan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SRAM and dual single ended bit sense for an SRAM
Publication number
20060176732
Publication date
Aug 10, 2006
Yuen H. Chan
G11 - INFORMATION STORAGE
Information
Patent Application
Cache late select circuit
Publication number
20050254285
Publication date
Nov 17, 2005
International Business Machines Corporation
Yuen H. Chan
G11 - INFORMATION STORAGE
Information
Patent Application
PROGRAMMABLE SENSE AMPLIFIER TIMING GENERATOR
Publication number
20050254317
Publication date
Nov 17, 2005
International Business Machines Corporation
Yuen H. Chan
G11 - INFORMATION STORAGE
Information
Patent Application
Method and apparatus for facilitating random pattern testing of log...
Publication number
20030070127
Publication date
Apr 10, 2003
Mary P. Kusko
G01 - MEASURING TESTING