Todd Marquart

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Memory sub-system event log management
- Patent number 12,118,229
- Issue date Oct 15, 2024
- Micron Technology, Inc.
- Adam J. Hieb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parity data in dynamic random access memory (DRAM)
- Patent number 12,061,518
- Issue date Aug 13, 2024
- Micron Technology, Inc.
- Sai Krishna Mylavarapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Separate partition for buffer and snapshot memory
- Patent number 11,789,629
- Issue date Oct 17, 2023
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Partitions within snapshot memory for buffer and snapshot memory
- Patent number 11,775,208
- Issue date Oct 3, 2023
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Threshold voltage based on program/erase cycles
- Patent number 11,776,629
- Issue date Oct 3, 2023
- Micron Technology, Inc.
- Niccolo′ Righetti
- G11 - INFORMATION STORAGE
Information Patent Grant
Read voltage calibration for copyback operation
- Patent number 11,694,763
- Issue date Jul 4, 2023
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Threshold voltage distribution adjustment for buffer
- Patent number 11,663,104
- Issue date May 30, 2023
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performing asynchronous scan operations across memory subsystems
- Patent number 11,650,750
- Issue date May 16, 2023
- Micron Technology, Inc.
- Kevin R. Brandt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parity data in dynamic random access memory (DRAM)
- Patent number 11,579,964
- Issue date Feb 14, 2023
- Micron Technology, Inc.
- Sai Krishna Mylavarapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data management during a copyback operation
- Patent number 11,556,267
- Issue date Jan 17, 2023
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trims corresponding to logical unit quantity
- Patent number 11,487,436
- Issue date Nov 1, 2022
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Partitioned memory having error detection capability
- Patent number 11,481,273
- Issue date Oct 25, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory sub-system event log management
- Patent number 11,449,266
- Issue date Sep 20, 2022
- Micron Technology, Inc.
- Adam J. Hieb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trims corresponding to program/erase cycles
- Patent number 11,437,111
- Issue date Sep 6, 2022
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G11 - INFORMATION STORAGE
Information Patent Grant
Separate partition for buffer and snapshot memory
- Patent number 11,385,819
- Issue date Jul 12, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Partitions within snapshot memory for buffer and snapshot memory
- Patent number 11,360,700
- Issue date Jun 14, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read voltage calibration for copyback operation
- Patent number 11,309,052
- Issue date Apr 19, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Separate trims for buffer and snapshot
- Patent number 11,301,346
- Issue date Apr 12, 2022
- Micron Technology, Inc.
- Todd A. Marquart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Threshold voltage distribution adjustment for buffer
- Patent number 11,288,160
- Issue date Mar 29, 2022
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive scan frequency for detecting errors in a memory system
- Patent number 10,846,165
- Issue date Nov 24, 2020
- Micron Technology, Inc.
- Kevin R. Brandt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining system lifetime characteristics
- Patent number 9,269,452
- Issue date Feb 23, 2016
- Micron Technology, Inc.
- Todd Marquart
- G11 - INFORMATION STORAGE
Information Patent Grant
Resting blocks of memory cells in response to the blocks being deem...
- Patent number 9,183,070
- Issue date Nov 10, 2015
- Micron Technology, Inc.
- Todd Marquart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lifetime markers for memory devices
- Patent number 8,854,892
- Issue date Oct 7, 2014
- Micron Technology, Inc.
- Todd A. Marquart
- G11 - INFORMATION STORAGE
Information Patent Grant
Determining system lifetime characteristics
- Patent number 8,804,428
- Issue date Aug 12, 2014
- Micron Technology, Inc.
- Todd Marquart
- G11 - INFORMATION STORAGE
Information Patent Grant
Lifetime markers for memory devices
- Patent number 8,320,185
- Issue date Nov 27, 2012
- Micron Technology, Inc.
- Todd Marquart
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic soft program trims
- Patent number 8,199,585
- Issue date Jun 12, 2012
- Micron Technology, Inc.
- Todd Marquart
- G11 - INFORMATION STORAGE
Information Patent Grant
Reducing effects of program disturb in a memory device
- Patent number 8,023,329
- Issue date Sep 20, 2011
- Micron Technology, Inc.
- Seiichi Aritome
- G11 - INFORMATION STORAGE
Information Patent Grant
Program-verify method
- Patent number 7,952,936
- Issue date May 31, 2011
- Micron Technology, Inc.
- Andrei Mihnea
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic soft program trims
- Patent number 7,920,427
- Issue date Apr 5, 2011
- Micron Technology, Inc.
- Todd Marquart
- G11 - INFORMATION STORAGE
Information Patent Grant
Reducing effects of program disturb in a memory device
- Patent number 7,715,234
- Issue date May 11, 2010
- Micron Technology, Inc.
- Seiichi Aritome
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PARITY DATA IN DYNAMIC RANDOM ACCESS MEMORY (DRAM)
- Publication number 20240403160
- Publication date Dec 5, 2024
- Micron Technology, Inc.
- Sai Krishna Mylavarapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARITY DATA IN DYNAMIC RANDOM ACCESS MEMORY (DRAM)
- Publication number 20230185660
- Publication date Jun 15, 2023
- Micron Technology, Inc.
- Sai Krishna Mylavarapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTITIONED MEMORY HAVING ERROR DETECTION CAPABILITY
- Publication number 20230044883
- Publication date Feb 9, 2023
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SUB-SYSTEM EVENT LOG MANAGEMENT
- Publication number 20230017942
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Adam J. Hieb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATE PARTITION FOR BUFFER AND SNAPSHOT MEMORY
- Publication number 20220350517
- Publication date Nov 3, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTITIONS WITHIN SNAPSHOT MEMORY FOR BUFFER AND SNAPSHOT MEMORY
- Publication number 20220291865
- Publication date Sep 15, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ VOLTAGE CALIBRATION FOR COPYBACK OPERATION
- Publication number 20220215895
- Publication date Jul 7, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARITY DATA IN DYNAMIC RANDOM ACCESS MEMORY (DRAM)
- Publication number 20220197737
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Sai Krishna Mylavarapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THRESHOLD VOLTAGE DISTRIBTUTION ADJUSTMENT FOR BUFFER
- Publication number 20220197771
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIMS CORRESPONDING TO PROGRAM/ERASE CYCLES
- Publication number 20220189571
- Publication date Jun 16, 2022
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G11 - INFORMATION STORAGE
Information Patent Application
DATA MANAGEMENT DURING A COPYBACK OPERATION
- Publication number 20220066642
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATE TRIMS FOR BUFFER AND SNAPSHOT
- Publication number 20220066898
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Todd A. Marquart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ VOLTAGE CALIBRATION FOR COPYBACK OPERATION
- Publication number 20220068426
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SUB-SYSTEM EVENT LOG MANAGEMENT
- Publication number 20220066679
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Adam J. Hieb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM DETERMINATION BASED ON POWER AVAILABILITY
- Publication number 20220057944
- Publication date Feb 24, 2022
- Micron Technology, Inc.
- Jeremy Binfet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTITIONED MEMORY HAVING ERROR DETECTION CAPABILITY
- Publication number 20220050746
- Publication date Feb 17, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIMS CORRESPONDING TO LOGICAL UNIT QUANTITY
- Publication number 20220050601
- Publication date Feb 17, 2022
- Micron Technology, Inc.
- Jeffrey S. McNeil Jr.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTITIONS WITHIN SNAPSHOT MEMORY FOR BUFFER AND SNAPSHOT MEMORY
- Publication number 20220050625
- Publication date Feb 17, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THRESHOLD VOLTAGE DISTRIBTUTION ADJUSTMENT FOR BUFFER
- Publication number 20220050759
- Publication date Feb 17, 2022
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THRESHOLD VOLTAGE BASED ON PROGRAM/ERASE CYCLES
- Publication number 20220051722
- Publication date Feb 17, 2022
- Micron Technology, Inc.
- Niccolo' Righetti
- G11 - INFORMATION STORAGE
Information Patent Application
SEPARATE PARTITION FOR BUFFER AND SNAPSHOT MEMORY
- Publication number 20220050613
- Publication date Feb 17, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PERFORMING ASYNCHRONOUS SCAN OPERATIONS ACROSS MEMORY SUBSYSTEMS
- Publication number 20210216235
- Publication date Jul 15, 2021
- Micron Technology, Inc.
- Kevin R. Brandt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE SCAN FREQUENCY FOR DETECTING ERRORS IN A MEMORY SYSTEM
- Publication number 20190354421
- Publication date Nov 21, 2019
- Micron Technology, Inc.
- Kevin R. Brandt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RESTING BLOCKS OF MEMORY CELLS IN RESPONSE TO THE BLOCKS BEING DEEM...
- Publication number 20150033087
- Publication date Jan 29, 2015
- Micron Technology, Inc.
- Todd Marquart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING SYSTEM LIFETIME CHARACTERISTICS
- Publication number 20140362647
- Publication date Dec 11, 2014
- Todd Marquart
- G11 - INFORMATION STORAGE
Information Patent Application
WEAR LEVELING MEMORY USING ERROR RATE
- Publication number 20130346812
- Publication date Dec 26, 2013
- Micron Technology, Inc.
- Shirish D. Bahirat
- G11 - INFORMATION STORAGE
Information Patent Application
LIFETIME MARKERS FOR MEMORY DEVICES
- Publication number 20130083606
- Publication date Apr 4, 2013
- Micron Technology, Inc.
- Todd Marquart
- G11 - INFORMATION STORAGE
Information Patent Application
DETERMINING SYSTEM LIFETIME CHARACTERISTICS
- Publication number 20130044546
- Publication date Feb 21, 2013
- Micron Technology, Inc.
- Todd Marquart
- G11 - INFORMATION STORAGE
Information Patent Application
LIFETIME MARKERS FOR MEMORY DEVICES
- Publication number 20110242901
- Publication date Oct 6, 2011
- Micron Technology, Inc.
- Todd Marquart
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC SOFT PROGRAM TRIMS
- Publication number 20110182122
- Publication date Jul 28, 2011
- Micron Technology, Inc.
- Todd Marquart
- G11 - INFORMATION STORAGE

Todd Marquart

Person

Patents Grantslast 30 patents

Memory sub-system event log management

Parity data in dynamic random access memory (DRAM)

Separate partition for buffer and snapshot memory

Partitions within snapshot memory for buffer and snapshot memory

Threshold voltage based on program/erase cycles

Read voltage calibration for copyback operation

Threshold voltage distribution adjustment for buffer

Performing asynchronous scan operations across memory subsystems

Parity data in dynamic random access memory (DRAM)

Data management during a copyback operation

Trims corresponding to logical unit quantity

Partitioned memory having error detection capability

Memory sub-system event log management

Trims corresponding to program/erase cycles

Separate partition for buffer and snapshot memory

Partitions within snapshot memory for buffer and snapshot memory

Read voltage calibration for copyback operation

Separate trims for buffer and snapshot

Threshold voltage distribution adjustment for buffer

Adaptive scan frequency for detecting errors in a memory system

Determining system lifetime characteristics

Resting blocks of memory cells in response to the blocks being deem...

Lifetime markers for memory devices

Determining system lifetime characteristics

Lifetime markers for memory devices

Dynamic soft program trims

Reducing effects of program disturb in a memory device

Program-verify method

Dynamic soft program trims

Reducing effects of program disturb in a memory device

Patents Applicationslast 30 patents

PARITY DATA IN DYNAMIC RANDOM ACCESS MEMORY (DRAM)

PARITY DATA IN DYNAMIC RANDOM ACCESS MEMORY (DRAM)

PARTITIONED MEMORY HAVING ERROR DETECTION CAPABILITY

MEMORY SUB-SYSTEM EVENT LOG MANAGEMENT

SEPARATE PARTITION FOR BUFFER AND SNAPSHOT MEMORY

PARTITIONS WITHIN SNAPSHOT MEMORY FOR BUFFER AND SNAPSHOT MEMORY

READ VOLTAGE CALIBRATION FOR COPYBACK OPERATION

PARITY DATA IN DYNAMIC RANDOM ACCESS MEMORY (DRAM)

THRESHOLD VOLTAGE DISTRIBTUTION ADJUSTMENT FOR BUFFER

TRIMS CORRESPONDING TO PROGRAM/ERASE CYCLES

DATA MANAGEMENT DURING A COPYBACK OPERATION

SEPARATE TRIMS FOR BUFFER AND SNAPSHOT

READ VOLTAGE CALIBRATION FOR COPYBACK OPERATION

MEMORY SUB-SYSTEM EVENT LOG MANAGEMENT

TRIM DETERMINATION BASED ON POWER AVAILABILITY

PARTITIONED MEMORY HAVING ERROR DETECTION CAPABILITY

TRIMS CORRESPONDING TO LOGICAL UNIT QUANTITY

PARTITIONS WITHIN SNAPSHOT MEMORY FOR BUFFER AND SNAPSHOT MEMORY

THRESHOLD VOLTAGE DISTRIBTUTION ADJUSTMENT FOR BUFFER

THRESHOLD VOLTAGE BASED ON PROGRAM/ERASE CYCLES

SEPARATE PARTITION FOR BUFFER AND SNAPSHOT MEMORY

PERFORMING ASYNCHRONOUS SCAN OPERATIONS ACROSS MEMORY SUBSYSTEMS

ADAPTIVE SCAN FREQUENCY FOR DETECTING ERRORS IN A MEMORY SYSTEM

RESTING BLOCKS OF MEMORY CELLS IN RESPONSE TO THE BLOCKS BEING DEEM...

DETERMINING SYSTEM LIFETIME CHARACTERISTICS

WEAR LEVELING MEMORY USING ERROR RATE

LIFETIME MARKERS FOR MEMORY DEVICES

DETERMINING SYSTEM LIFETIME CHARACTERISTICS

LIFETIME MARKERS FOR MEMORY DEVICES

DYNAMIC SOFT PROGRAM TRIMS