Tokuya Osawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device which transmits or receives a signal to or fro...
- Patent number 7,983,112
- Issue date Jul 19, 2011
- Renesas Electronics Corporation
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Interface circuit
- Patent number 7,724,606
- Issue date May 25, 2010
- Renesas Technology Corp.
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and impedance adjusting method thereof
- Patent number 7,535,251
- Issue date May 19, 2009
- Renesas Technology Corp.
- Chikayoshi Morishima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for testing semiconductor integrated circuits
- Patent number 6,742,149
- Issue date May 25, 2004
- Renesas Technology Corp.
- Tokuya Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device with fault analysis function
- Patent number 6,571,364
- Issue date May 27, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hideshi Maeno
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device with test circuit
- Patent number 6,397,363
- Issue date May 28, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hideshi Maeno
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 6,286,121
- Issue date Sep 4, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tokuya Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and a redundancy circuit for an internal memory circuit
- Patent number 6,275,963
- Issue date Aug 14, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Hideshi Maeno
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit
- Patent number 5,960,008
- Issue date Sep 28, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tokuya Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory testing device
- Patent number 5,946,247
- Issue date Aug 31, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit
- Patent number 5,905,737
- Issue date May 18, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan path forming circuit
- Patent number 5,903,579
- Issue date May 11, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tokuya Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory testing device
- Patent number 5,815,512
- Issue date Sep 29, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having scan path for testing
- Patent number 5,724,367
- Issue date Mar 3, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit
- Patent number 5,703,818
- Issue date Dec 30, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test circuit
- Patent number 5,636,225
- Issue date Jun 3, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Tokuya Osawa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INTERFACE CIRCUIT
- Publication number 20100257324
- Publication date Oct 7, 2010
- Renesas Technology Corp.
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device
- Publication number 20080181047
- Publication date Jul 31, 2008
- RENESAS TECHNOLOGY CORP.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND IMPEDANCE ADJUSTING METHOD THEREOF
- Publication number 20080068040
- Publication date Mar 20, 2008
- Chikayoshi Morishima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Interface circuit
- Publication number 20080031079
- Publication date Feb 7, 2008
- Renesas Technology Corp.
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatus for testing semiconductor integrated circuits
- Publication number 20020026612
- Publication date Feb 28, 2002
- Tokuya Osawa
- G01 - MEASURING TESTING

Tokuya Osawa

Person

Patents Grantslast 30 patents

Semiconductor device which transmits or receives a signal to or fro...

Interface circuit

Semiconductor device and impedance adjusting method thereof

Apparatus for testing semiconductor integrated circuits

Semiconductor integrated circuit device with fault analysis function

Semiconductor integrated circuit device with test circuit

Semiconductor device

Test circuit and a redundancy circuit for an internal memory circuit

Test circuit

Semiconductor memory testing device

Test circuit

Scan path forming circuit

Semiconductor memory testing device

Semiconductor memory device having scan path for testing

Test circuit

Memory test circuit

Patents Applicationslast 30 patents

INTERFACE CIRCUIT

Semiconductor device

SEMICONDUCTOR DEVICE AND IMPEDANCE ADJUSTING METHOD THEREOF

Interface circuit

Apparatus for testing semiconductor integrated circuits