Tom D. Ohe

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Tempe, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Continuous selftest for inertial sensors at 0 Hz
- Patent number 9,817,023
- Issue date Nov 14, 2017
- NXP USA, INC.
- Todd F. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Dual sensor system having fault detection capability
- Patent number 7,855,562
- Issue date Dec 21, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Liviu Chiaburu
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor featuring offset cancellation and method of making
- Patent number 7,673,519
- Issue date Mar 9, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Marco Fuhrmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTINUOUS SELFTEST FOR INERTIAL SENSORS AT 0 HZ
- Publication number 20140182351
- Publication date Jul 3, 2014
- TODD F. MILLER
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS SELFTEST FOR INERTIAL SENSORS AT 0 HZ
- Publication number 20100122565
- Publication date May 20, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Todd F. Miller
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR FEATURING OFFSET CANCELLATION AND METHOD OF MAKING
- Publication number 20100050776
- Publication date Mar 4, 2010
- Marco Fuhrmann
- G01 - MEASURING TESTING
Information Patent Application
DUAL SENSOR SYSTEM HAVING FAULT DETECTION CAPABILITY
- Publication number 20090128160
- Publication date May 21, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Liviu Chiaburu
- G01 - MEASURING TESTING