Tom Spikes Jr.

Person

Round Rock, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Eliminating dishing non-uniformity of a process layer
- Patent number 6,599,174
- Issue date Jul 29, 2003
- Advanced Micro Devices, Inc.
- Thomas E. Spikes
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for enhancing endpoint detection of a via etch
- Patent number 6,555,396
- Issue date Apr 29, 2003
- Advanced Micro Devices, Inc.
- Ailian Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor formed using a dual metal process for gate and source/dr...
- Patent number 6,458,678
- Issue date Oct 1, 2002
- Advanced Micro Devices, Inc.
- Thomas E. Spikes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting voltage contrast in a semiconduc...
- Patent number 6,448,099
- Issue date Sep 10, 2002
- Advanced Micro Devices, Inc.
- John A. Iacoponi
- G01 - MEASURING TESTING
Information Patent Grant
Method of making salicidation of source and drain regions with meta...
- Patent number 6,326,251
- Issue date Dec 4, 2001
- Advanced Micro Devices
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated formation of LDD and non-LDD semiconductor devices
- Patent number 6,309,936
- Issue date Oct 30, 2001
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interlayer between titanium nitride and high density plasma oxide
- Patent number 6,271,112
- Issue date Aug 7, 2001
- Advanced Micro Devices, Inc.
- Christopher L. Wooten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit isolation structure employing a protective layer...
- Patent number 6,239,476
- Issue date May 29, 2001
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making high performance MOSFET with enhanced gate oxide i...
- Patent number 6,228,724
- Issue date May 8, 2001
- Advanced Mirco Devices
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra short transistor channel length dictated by the width of a si...
- Patent number 6,225,201
- Issue date May 1, 2001
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making high performance mosfets having high conductivity...
- Patent number 6,211,000
- Issue date Apr 3, 2001
- Advanced Micro Devices
- Thomas E. Spikes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High density trench fill due to new spacer fill method including is...
- Patent number 6,194,283
- Issue date Feb 27, 2001
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor sidewall spacers composed of silicon nitride CVD deposit...
- Patent number 6,171,917
- Issue date Jan 9, 2001
- Advanced Micro Devices, Inc.
- Sey-Ping Sun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit utilizing an air gap to reduce capacitance betwe...
- Patent number 6,160,316
- Issue date Dec 12, 2000
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for elevated source/drain with polished gate e...
- Patent number 6,140,190
- Issue date Oct 31, 2000
- Advanced Micro Devices
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for upper level substrate isolation integrated...
- Patent number 6,140,163
- Issue date Oct 31, 2000
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spacer structure as transistor gate
- Patent number 6,124,174
- Issue date Sep 26, 2000
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing an isolation region in a semiconductor devi...
- Patent number 6,114,219
- Issue date Sep 5, 2000
- Advanced Micro Devices, Inc.
- Thomas E. Spikes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formulation of high performance transistors using gate trim etch pr...
- Patent number 6,110,785
- Issue date Aug 29, 2000
- Advanced Micro Devices, Inc.
- Thomas E. Spikes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making ultra thin gate oxide using aluminum oxide
- Patent number 6,100,204
- Issue date Aug 8, 2000
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for isolating semiconductor devices after tran...
- Patent number 6,074,904
- Issue date Jun 13, 2000
- Advanced Micro Devices, Inc.
- Thomas E. Spikes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having gate electrodes with different gate ins...
- Patent number 6,064,102
- Issue date May 16, 2000
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flash memory device having high permittivity stacked dielectric and...
- Patent number 6,048,766
- Issue date Apr 11, 2000
- Advanced Micro Devices
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device using advanced conta...
- Patent number 6,037,244
- Issue date Mar 14, 2000
- Advanced MicroDevices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor fabrication employing a flowable oxide to enhance pla...
- Patent number 5,981,354
- Issue date Nov 9, 1999
- Advanced Micro Devices, Inc.
- Thomas E. Spikes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor fabrication employing a local interconnect
- Patent number 5,970,375
- Issue date Oct 19, 1999
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having nitrogen enhanced high permittivity gat...
- Patent number 5,963,810
- Issue date Oct 5, 1999
- Advanced Micro Devices
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device by doping an active...
- Patent number 5,946,581
- Issue date Aug 31, 1999
- Advanced Micro Devices
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Small gate electrode MOSFET
- Patent number 5,942,787
- Issue date Aug 24, 1999
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for an advanced isolation spacer shell
- Patent number 5,933,747
- Issue date Aug 3, 1999
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS

Tom Spikes Jr.

Person

Patents Grantslast 30 patents

Eliminating dishing non-uniformity of a process layer

Method and apparatus for enhancing endpoint detection of a via etch

Transistor formed using a dual metal process for gate and source/dr...

Method and apparatus for detecting voltage contrast in a semiconduc...

Method of making salicidation of source and drain regions with meta...

Integrated formation of LDD and non-LDD semiconductor devices

Interlayer between titanium nitride and high density plasma oxide

Integrated circuit isolation structure employing a protective layer...

Method of making high performance MOSFET with enhanced gate oxide i...

Ultra short transistor channel length dictated by the width of a si...

Method of making high performance mosfets having high conductivity...

High density trench fill due to new spacer fill method including is...

Transistor sidewall spacers composed of silicon nitride CVD deposit...

Integrated circuit utilizing an air gap to reduce capacitance betwe...

Method and structure for elevated source/drain with polished gate e...

Method and apparatus for upper level substrate isolation integrated...

Spacer structure as transistor gate

Method of manufacturing an isolation region in a semiconductor devi...

Formulation of high performance transistors using gate trim etch pr...

Method of making ultra thin gate oxide using aluminum oxide

Method and structure for isolating semiconductor devices after tran...

Semiconductor device having gate electrodes with different gate ins...

Flash memory device having high permittivity stacked dielectric and...

Method of manufacturing a semiconductor device using advanced conta...

Semiconductor fabrication employing a flowable oxide to enhance pla...

Semiconductor fabrication employing a local interconnect

Semiconductor device having nitrogen enhanced high permittivity gat...

Method of manufacturing a semiconductor device by doping an active...

Small gate electrode MOSFET

Method and structure for an advanced isolation spacer shell