Tomi Tuohimaa

Person

Stockholm, SE

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray source with an electromagnetic pump
- Patent number 11,979,972
- Issue date May 7, 2024
- Excillum AB
- Björn Hansson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray source with an electromagnetic pump
- Patent number 11,910,515
- Issue date Feb 20, 2024
- Excillum AB
- Ulf Lundström
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterization of an electron beam
- Patent number 11,892,576
- Issue date Feb 6, 2024
- Excillum AB
- Per Takman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron collector with oblique impact portion
- Patent number 11,651,927
- Issue date May 16, 2023
- Excillum AB
- Tomi Tuohimaa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterization of an electron beam
- Patent number 11,579,318
- Issue date Feb 14, 2023
- Excillum AB
- Per Takman
- G01 - MEASURING TESTING
Information Patent Grant
Method for protecting an X-ray source and an X-ray source
- Patent number 11,438,996
- Issue date Sep 6, 2022
- Excillum AB
- Tomi Tuohimaa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Vapour monitoring
- Patent number 10,930,464
- Issue date Feb 23, 2021
- Excillum AB
- Per Takman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray source with ionisation tool
- Patent number 10,825,642
- Issue date Nov 3, 2020
- Excillum AB
- Tomi Tuohimaa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid target X-ray source with jet mixing tool
- Patent number 10,818,468
- Issue date Oct 27, 2020
- Excillum AB
- Björn Hansson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structured x-ray target
- Patent number 10,784,069
- Issue date Sep 22, 2020
- Excillum AB
- Tomi Tuohimaa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aligning and focusing an electron beam in an X-ray source
- Patent number 9,947,502
- Issue date Apr 17, 2018
- Excillum AB
- Oscar Hemberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Limiting migration of target material
- Patent number 9,564,283
- Issue date Feb 7, 2017
- Excillum AB
- Oscar Hemberg
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Supply of a liquid-metal target in X-ray generation
- Patent number 9,530,607
- Issue date Dec 27, 2016
- Excillum AB
- Oscar Hemberg
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Aligning and focusing an electron beam in an X-ray source
- Patent number 9,380,690
- Issue date Jun 28, 2016
- Excillum AB
- Oscar Hemberg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Coated X-ray window
- Patent number 9,245,707
- Issue date Jan 26, 2016
- Excillum AB
- Tomi Tuohimaa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Coated X-ray window
- Patent number 9,171,693
- Issue date Oct 27, 2015
- Excillum AB
- Oscar Hemberg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Supply of a liquid-metal target in X-ray generation
- Patent number 8,837,679
- Issue date Sep 16, 2014
- Excillum AB
- Oscar Hemberg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray window
- Patent number 8,681,943
- Issue date Mar 25, 2014
- Excillum AB
- Hans Hertz
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Debris reduction in electron-impact X-ray sources
- Patent number 8,170,179
- Issue date May 1, 2012
- Jettec AB
- Hans M. Hertz
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND ARRANGEMENT FOR AN X-RAY SOURCE
- Publication number 20250046560
- Publication date Feb 6, 2025
- Excillum AB
- Per Takman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS
- Publication number 20240355577
- Publication date Oct 24, 2024
- Eldico Scientific AG
- Gunther STEINFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING SYSTEM
- Publication number 20230238204
- Publication date Jul 27, 2023
- Excillum AB
- Björn HANSSON
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF AN ELECTRON BEAM
- Publication number 20230176239
- Publication date Jun 8, 2023
- Excillum AB
- Per TAKMAN
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF AN ELECTRON BEAM
- Publication number 20220404514
- Publication date Dec 22, 2022
- Excillum AB
- Per TAKMAN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE WITH AN ELECTROMAGNETIC PUMP
- Publication number 20220230832
- Publication date Jul 21, 2022
- Excillum AB
- Björn HANSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY SOURCE WITH AN ELECTROMAGNETIC PUMP
- Publication number 20220220951
- Publication date Jul 14, 2022
- Excillum AB
- Ulf LUNDSTRÖM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON COLLECTOR WITH OBLIQUE IMPACT PORTION
- Publication number 20220028645
- Publication date Jan 27, 2022
- Excillum AB
- Tomi TUOHIMAA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD FOR PROTECTING AN X-RAY SOURCE AND AN X-RAY SOURCE
- Publication number 20200367351
- Publication date Nov 19, 2020
- Excillum AB
- Tomi TUOHIMAA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
VAPOUR MONITORING
- Publication number 20200058461
- Publication date Feb 20, 2020
- Excillum AB
- Per TAKMAN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
STRUCTURED X-RAY TARGET
- Publication number 20190311874
- Publication date Oct 10, 2019
- Excillum AB
- Tomi TUOHIMAA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY SOURCE WITH IONISATION TOOL
- Publication number 20190131103
- Publication date May 2, 2019
- Excillum AB
- Tomi Tuohimaa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNING AND FOCUSING AN ELECTRON BEAM IN AN X-RAY SOURCE
- Publication number 20160247656
- Publication date Aug 25, 2016
- Excillum AB
- Oscar Hemberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIMITING MIGRATION OF TARGET MATERIAL
- Publication number 20150179388
- Publication date Jun 25, 2015
- Excillum AB
- Oscar Hemberg
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
COATED X-RAY WINDOW
- Publication number 20150146866
- Publication date May 28, 2015
- Excillum AB
- Tomi Tuohimaa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPPLY OF A LIQUID-METAL TARGET IN X-RAY GENERATION
- Publication number 20140348302
- Publication date Nov 27, 2014
- Excillum AB
- Oscar Hemberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNING AND FOCUSING AN ELECTRON BEAM IN AN X-RAY SOURCE
- Publication number 20130301805
- Publication date Nov 14, 2013
- Excillum AB
- Oscar Hemberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COATED X-RAY WINDOW
- Publication number 20130235979
- Publication date Sep 12, 2013
- Excillum AB
- Oscar Hemberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPPLY OF A LIQUID-METAL TARGET IN X-RAY GENERATION
- Publication number 20120057680
- Publication date Mar 8, 2012
- Excillum AB
- Oscar Hemberg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY WINDOW
- Publication number 20110317818
- Publication date Dec 29, 2011
- Excillum AB
- Hans Hertz
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Debris Reduction in Electron-Impact X-Ray Sources
- Publication number 20090141864
- Publication date Jun 4, 2009
- Jettec AB
- Hans M. Hertz
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Tomi Tuohimaa

Person

Patents Grantslast 30 patents

X-ray source with an electromagnetic pump

X-ray source with an electromagnetic pump

Characterization of an electron beam

Electron collector with oblique impact portion

Characterization of an electron beam

Method for protecting an X-ray source and an X-ray source

Vapour monitoring

X-ray source with ionisation tool

Liquid target X-ray source with jet mixing tool

Structured x-ray target

Aligning and focusing an electron beam in an X-ray source

Limiting migration of target material

Supply of a liquid-metal target in X-ray generation

Aligning and focusing an electron beam in an X-ray source

Coated X-ray window

Coated X-ray window

Supply of a liquid-metal target in X-ray generation

X-ray window

Debris reduction in electron-impact X-ray sources

Patents Applicationslast 30 patents

METHOD AND ARRANGEMENT FOR AN X-RAY SOURCE

CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS

X-RAY IMAGING SYSTEM

CHARACTERIZATION OF AN ELECTRON BEAM

CHARACTERIZATION OF AN ELECTRON BEAM

X-RAY SOURCE WITH AN ELECTROMAGNETIC PUMP

X-RAY SOURCE WITH AN ELECTROMAGNETIC PUMP

ELECTRON COLLECTOR WITH OBLIQUE IMPACT PORTION

A METHOD FOR PROTECTING AN X-RAY SOURCE AND AN X-RAY SOURCE

VAPOUR MONITORING

STRUCTURED X-RAY TARGET

X-RAY SOURCE WITH IONISATION TOOL

ALIGNING AND FOCUSING AN ELECTRON BEAM IN AN X-RAY SOURCE

LIMITING MIGRATION OF TARGET MATERIAL

COATED X-RAY WINDOW

SUPPLY OF A LIQUID-METAL TARGET IN X-RAY GENERATION

ALIGNING AND FOCUSING AN ELECTRON BEAM IN AN X-RAY SOURCE

COATED X-RAY WINDOW

SUPPLY OF A LIQUID-METAL TARGET IN X-RAY GENERATION

X-RAY WINDOW

Debris Reduction in Electron-Impact X-Ray Sources