Tomihiro Hashizume

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron source, method for manufacturing the same, and electron be...
- Patent number 11,322,329
- Issue date May 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle measuring device and particle measuring method
- Patent number 11,143,606
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Field ionization source, ion beam apparatus, and beam irradiation m...
- Patent number 10,971,329
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and cleaning method for gas field ion source
- Patent number 10,840,070
- Issue date Nov 17, 2020
- HITACHI HIGH-TECH CORPORATION
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source and electron beam device using the same
- Patent number 10,707,046
- Issue date Jul 7, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample for measuring particles, method for measuring particles and...
- Patent number 10,697,767
- Issue date Jun 30, 2020
- Hitachi High-Technologies Corporation
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Field emission electron source, method for manufacturing same, and...
- Patent number 10,586,674
- Issue date Mar 10, 2020
- Hitachi High-Technologies Corporation
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 10,522,319
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam apparatus and ion beam irradiation method
- Patent number 10,211,022
- Issue date Feb 19, 2019
- Hitachi High-Technologies Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope and its sample holder
- Patent number 10,073,116
- Issue date Sep 11, 2018
- Hitachi, Ltd.
- Sanato Nagata
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder and analytical vacuum device
- Patent number 9,875,878
- Issue date Jan 23, 2018
- Hitachi, Ltd.
- Takeshi Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope and measuring method using same
- Patent number 9,423,416
- Issue date Aug 23, 2016
- Hitachi, Ltd.
- Akira Nambu
- G01 - MEASURING TESTING
Information Patent Grant
Gas field ion source and method for using same, ion beam device, an...
- Patent number 8,847,173
- Issue date Sep 30, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Gas field ion source, charged particle microscope, and apparatus
- Patent number 8,530,865
- Issue date Sep 10, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ion source, charged particle microscope, and apparatus
- Patent number 8,115,184
- Issue date Feb 14, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin-film transistor device and a method for manufacturing the same
- Patent number 8,008,654
- Issue date Aug 30, 2011
- Hitachi, Ltd.
- Takeo Shiba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Organic thin film transistor array and method of manufacturing the...
- Patent number 7,872,257
- Issue date Jan 18, 2011
- Hitachi, Ltd.
- Tomihiro Hashizume
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring and organic transistor, and manufacturing method thereof
- Patent number 7,872,254
- Issue date Jan 18, 2011
- Hitachi, Ltd.
- Yuji Suwa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Field effect transistor and its manufacturing method
- Patent number 7,807,496
- Issue date Oct 5, 2010
- Hitachi, Ltd.
- Masaaki Fujimori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of coating substrate
- Patent number 7,799,701
- Issue date Sep 21, 2010
- Hitachi, Ltd.
- Seiji Heike
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Field effect transistor and manufacturing method thereof
- Patent number 7,772,622
- Issue date Aug 10, 2010
- Hitachi, Ltd.
- Masaaki Fujimori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Organic transistor using self-assembled monolayer
- Patent number 7,622,734
- Issue date Nov 24, 2009
- Hitachi, Ltd.
- Yuji Suwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor having a structure in which an organic semi...
- Patent number 7,608,857
- Issue date Oct 27, 2009
- Hitachi, Ltd.
- Masaaki Fujimori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oscillator and frequency detector
- Patent number 7,557,662
- Issue date Jul 7, 2009
- Hitachi, Ltd.
- Seiji Heike
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electric-field-effect magnetoresistive devices and electronic devic...
- Patent number 7,298,594
- Issue date Nov 20, 2007
- Hitachi, Ltd.
- Toshiyuki Onogi
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe for scanning probe lithography and making method thereof
- Patent number 7,115,863
- Issue date Oct 3, 2006
- Hitachi, Ltd.
- Masayoshi Ishibashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and its production method
- Patent number 6,780,698
- Issue date Aug 24, 2004
- Hitachi, Ltd.
- Yuji Suwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron exposure device and method and electronic characteristics...
- Patent number 6,670,622
- Issue date Dec 30, 2003
- Hitachi, Ltd.
- Seiji Heike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ferromagnetic material and magnetic apparatus employing the ferroma...
- Patent number 6,475,650
- Issue date Nov 5, 2002
- Hitachi, Ltd.
- Satoshi Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron exposure apparatus
- Patent number 6,366,340
- Issue date Apr 2, 2002
- Hitachi, Ltd.
- Masayoshi Ishibashi
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Electron Source, Electron Beam Device, and Method for Manufacturing...
- Publication number 20220415603
- Publication date Dec 29, 2022
- Hitachi High-Tech Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...
- Publication number 20210327674
- Publication date Oct 21, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD
- Publication number 20200371050
- Publication date Nov 26, 2020
- Hitachi High-Tech Corporation
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Application
ION BEAM DEVICE AND CLEANING METHOD FOR GAS FIELD ION SOURCE
- Publication number 20200294776
- Publication date Sep 17, 2020
- Hitachi High-Technologies Corporation
- Yoshimi KAWANAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source and Electron Beam Device Using the Same
- Publication number 20190385809
- Publication date Dec 19, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus
- Publication number 20190237289
- Publication date Aug 1, 2019
- Hitachi High-Technologies Corporation
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE FOR MEASURING PARTICLES, METHOD FOR MEASURING PARTICLES AND...
- Publication number 20190178640
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Tomihiro HASHIZUME
- G01 - MEASURING TESTING
Information Patent Application
Field Emission Electron Source, Method for Manufacturing Same, and...
- Publication number 20190066966
- Publication date Feb 28, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD IONIZATION SOURCE, ION BEAM APPARATUS, AND BEAM IRRADIATION M...
- Publication number 20190051491
- Publication date Feb 14, 2019
- Hitachi High-Technologies Corporation
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE HOLDER THEREFOR
- Publication number 20170343580
- Publication date Nov 30, 2017
- Hitachi, Ltd
- Sanato NAGATA
- G01 - MEASURING TESTING
Information Patent Application
ION BEAM APPARATUS AND ION BEAM IRRADIATION METHOD
- Publication number 20170229277
- Publication date Aug 10, 2017
- Hitachi High-Technologies Corporation
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER AND ANALYTICAL VACUUM DEVICE
- Publication number 20170004952
- Publication date Jan 5, 2017
- Hitachi, Ltd
- Takeshi NAKAYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLDER FOR PROBE MICROSCOPE, PROBE MICROSCOPE AND SPECIMEN MEASUREM...
- Publication number 20150192604
- Publication date Jul 9, 2015
- Hitachi, Ltd
- Tsuyoshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND MEASURING METHOD USING SAME
- Publication number 20150177275
- Publication date Jun 25, 2015
- Hitachi, Ltd.
- Akira Nambu
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20130279652
- Publication date Oct 24, 2013
- Hitachi, Ltd
- Akira NAMBU
- G01 - MEASURING TESTING
Information Patent Application
GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...
- Publication number 20130119252
- Publication date May 16, 2013
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...
- Publication number 20130087704
- Publication date Apr 11, 2013
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- B82 - NANO-TECHNOLOGY
Information Patent Application
NEURAL ACTIVITY MEASUREMENT SYSTEM
- Publication number 20120185173
- Publication date Jul 19, 2012
- Hitachi, Ltd.
- Tsuyoshi YAMAMOTO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
GAS FIELD ION SOURCE, CHARGED PARTICLE MICROSCOPE, AND APPARATUS
- Publication number 20120119086
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas field ion source, charged particle microscope, and apparatus
- Publication number 20090173888
- Publication date Jul 9, 2009
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas field ionization ion source, scanning charged particle microsco...
- Publication number 20090152462
- Publication date Jun 18, 2009
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- B82 - NANO-TECHNOLOGY
Information Patent Application
Thin-film transistor device and a method for manufacturing the same
- Publication number 20090001361
- Publication date Jan 1, 2009
- Hitachi, Ltd.
- Takeo Shiba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Organic Thin Film Transistor Array and Method of Manufacturing the...
- Publication number 20080315191
- Publication date Dec 25, 2008
- Hitachi, Ltd.
- Tomihiro Hashizume
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of coating substrate
- Publication number 20080299292
- Publication date Dec 4, 2008
- Hitachi, Ltd.
- Seiji Heike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Picture element driving circuit of display panel and display device...
- Publication number 20080099760
- Publication date May 1, 2008
- Hitachi, Ltd.
- Masaaki Fujimori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Organic Transistor Using Self-Assembled Monolayer
- Publication number 20080087883
- Publication date Apr 17, 2008
- YUJI SUWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Oscillator and frequency detector
- Publication number 20080084248
- Publication date Apr 10, 2008
- Hitachi, Ltd.
- Seiji Heike
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FIELD EFFECT TRANSISTOR, ORGANIC THIN-FILM TRANSISTOR AND MANUFACTU...
- Publication number 20080012009
- Publication date Jan 17, 2008
- Tomihiro Hashizume
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIRING AND ORGANIC TRANSISTOR, AND MANUFACTURING METHOD THEREOF
- Publication number 20070275500
- Publication date Nov 29, 2007
- Yuji Suwa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Field Effect Transistor and Manufacturing Method Thereof
- Publication number 20070252229
- Publication date Nov 1, 2007
- Masaaki Fujimori
- H01 - BASIC ELECTRIC ELEMENTS

Tomihiro Hashizume

Person

Patents Grantslast 30 patents

Electron source, method for manufacturing the same, and electron be...

Particle measuring device and particle measuring method

Field ionization source, ion beam apparatus, and beam irradiation m...

Ion beam device and cleaning method for gas field ion source

Electron source and electron beam device using the same

Sample for measuring particles, method for measuring particles and...

Field emission electron source, method for manufacturing same, and...

Electron beam apparatus

Ion beam apparatus and ion beam irradiation method

Scanning probe microscope and its sample holder

Sample holder and analytical vacuum device

Scanning probe microscope and measuring method using same

Gas field ion source and method for using same, ion beam device, an...

Gas field ion source, charged particle microscope, and apparatus

Gas field ion source, charged particle microscope, and apparatus

Thin-film transistor device and a method for manufacturing the same

Organic thin film transistor array and method of manufacturing the...

Wiring and organic transistor, and manufacturing method thereof

Field effect transistor and its manufacturing method

Method of coating substrate

Field effect transistor and manufacturing method thereof

Organic transistor using self-assembled monolayer

Field effect transistor having a structure in which an organic semi...

Oscillator and frequency detector

Electric-field-effect magnetoresistive devices and electronic devic...

Probe for scanning probe lithography and making method thereof

Semiconductor device and its production method

Electron exposure device and method and electronic characteristics...

Ferromagnetic material and magnetic apparatus employing the ferroma...

Electron exposure apparatus

Patents Applicationslast 30 patents

Electron Source, Electron Beam Device, and Method for Manufacturing...

ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...

PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD

ION BEAM DEVICE AND CLEANING METHOD FOR GAS FIELD ION SOURCE

Electron Source and Electron Beam Device Using the Same

Electron Beam Apparatus

SAMPLE FOR MEASURING PARTICLES, METHOD FOR MEASURING PARTICLES AND...

Field Emission Electron Source, Method for Manufacturing Same, and...

FIELD IONIZATION SOURCE, ION BEAM APPARATUS, AND BEAM IRRADIATION M...

SCANNING PROBE MICROSCOPE AND SAMPLE HOLDER THEREFOR

ION BEAM APPARATUS AND ION BEAM IRRADIATION METHOD

SAMPLE HOLDER AND ANALYTICAL VACUUM DEVICE

HOLDER FOR PROBE MICROSCOPE, PROBE MICROSCOPE AND SPECIMEN MEASUREM...

SCANNING PROBE MICROSCOPE AND MEASURING METHOD USING SAME

MEASURING APPARATUS

GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...

GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...

NEURAL ACTIVITY MEASUREMENT SYSTEM

GAS FIELD ION SOURCE, CHARGED PARTICLE MICROSCOPE, AND APPARATUS

Gas field ion source, charged particle microscope, and apparatus

Gas field ionization ion source, scanning charged particle microsco...

Thin-film transistor device and a method for manufacturing the same

Organic Thin Film Transistor Array and Method of Manufacturing the...

Method of coating substrate

Picture element driving circuit of display panel and display device...

Organic Transistor Using Self-Assembled Monolayer

Oscillator and frequency detector

FIELD EFFECT TRANSISTOR, ORGANIC THIN-FILM TRANSISTOR AND MANUFACTU...

WIRING AND ORGANIC TRANSISTOR, AND MANUFACTURING METHOD THEREOF

Field Effect Transistor and Manufacturing Method Thereof