Tomohiko Kanemitsu

Person

Toyonaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Distance measuring device and solid-state image sensor used therein
- Patent number 10,281,565
- Issue date May 7, 2019
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Syoma Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing circuit and semiconductor testing method
- Patent number 7,733,112
- Issue date Jun 8, 2010
- Panasonic Corporation
- Satoshi Kishimoto
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for LSI test and method for the test
- Patent number 7,251,761
- Issue date Jul 31, 2007
- Matsushita Electric Industrial Co., Ltd.
- Wataru Itoh
- G01 - MEASURING TESTING
Information Patent Grant
Ancillary equipment for testing semiconductor integrated circuit
- Patent number 7,148,676
- Issue date Dec 12, 2006
- Matsushita Electric Industrial Co., Ltd.
- Satoru Kamano
- G01 - MEASURING TESTING
Information Patent Grant
Decrypting device
- Patent number 6,393,564
- Issue date May 21, 2002
- Matsushita Electric Industrial Co., Ltd.
- Tomohiko Kanemitsu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
IMAGING DEVICE AND SOLID-STATE IMAGING ELEMENT USED IN SAME
- Publication number 20180259647
- Publication date Sep 13, 2018
- Panasonic Intellectual Property Management Co., Ltd.
- Haruka TAKANO
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE AND SOLID-STATE IMAGE SENSOR USED THEREIN
- Publication number 20170074976
- Publication date Mar 16, 2017
- Panasonic Intellectual Property Management Co., Ltd.
- SYOMA TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING APPARATUS AND TESTING METHOD
- Publication number 20110298487
- Publication date Dec 8, 2011
- Nobuhiro KATSUMA
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTIVE CONTACT PIN AND SEMICONDUCTOR TESTING EQUIPMENT
- Publication number 20090243640
- Publication date Oct 1, 2009
- Panasonic Corporation
- Nobuhiro Katsuma
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING CIRCUIT AND SEMICONDUCTOR TESTING METHOD
- Publication number 20090021279
- Publication date Jan 22, 2009
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Kishimoto
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor testing equipment and semiconductor testing method
- Publication number 20080094096
- Publication date Apr 24, 2008
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Kishimoto
- G01 - MEASURING TESTING
Information Patent Application
Handler and method of testing semiconductor device by means of the...
- Publication number 20080007285
- Publication date Jan 10, 2008
- Matsushita Electric Industrial Co., Ltd.
- Masayuki Nakase
- G01 - MEASURING TESTING
Information Patent Application
Test equipment for semiconductor
- Publication number 20060200714
- Publication date Sep 7, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Satoru Kamano
- G11 - INFORMATION STORAGE
Information Patent Application
High-speed interface circuit test module, module under high-speed i...
- Publication number 20050258856
- Publication date Nov 24, 2005
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Kishimoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Ancillary equipment for testing semiconductor integrated circuit
- Publication number 20040257066
- Publication date Dec 23, 2004
- Matsushita Elec. Ind. Co. Ltd.
- Satoru Kamano
- G01 - MEASURING TESTING
Information Patent Application
Assembly for LSI test and method for the test
- Publication number 20040160237
- Publication date Aug 19, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Wataru Itoh
- G01 - MEASURING TESTING
Information Patent Application
Lsi inspection method and apparatus, and ls1 tester
- Publication number 20040133834
- Publication date Jul 8, 2004
- Tomohiko Kanemitsu
- G01 - MEASURING TESTING

Tomohiko Kanemitsu

Person

Patents Grantslast 30 patents

Distance measuring device and solid-state image sensor used therein

Semiconductor testing circuit and semiconductor testing method

Assembly for LSI test and method for the test

Ancillary equipment for testing semiconductor integrated circuit

Decrypting device

Patents Applicationslast 30 patents

IMAGING DEVICE AND SOLID-STATE IMAGING ELEMENT USED IN SAME

DISTANCE MEASURING DEVICE AND SOLID-STATE IMAGE SENSOR USED THEREIN

SEMICONDUCTOR TESTING APPARATUS AND TESTING METHOD

CONDUCTIVE CONTACT PIN AND SEMICONDUCTOR TESTING EQUIPMENT

SEMICONDUCTOR TESTING CIRCUIT AND SEMICONDUCTOR TESTING METHOD

Semiconductor testing equipment and semiconductor testing method

Handler and method of testing semiconductor device by means of the...

Test equipment for semiconductor

High-speed interface circuit test module, module under high-speed i...

Ancillary equipment for testing semiconductor integrated circuit

Assembly for LSI test and method for the test

Lsi inspection method and apparatus, and ls1 tester