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Tomohito Kunda
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Okazaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for manufacturing electronic device including package
Patent number
7,320,940
Issue date
Jan 22, 2008
Denso Corporation
Tomohito Kunda
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Pressure sensor
Patent number
7,228,745
Issue date
Jun 12, 2007
Denso Corporation
Tomohito Kunda
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor capable of outputting time-serial signal i...
Patent number
7,082,830
Issue date
Aug 1, 2006
Denso Corporation
Tomohito Kunda
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Capacitive-type acceleration sensor
Patent number
6,923,060
Issue date
Aug 2, 2005
Denso Corporation
Takashi Katsumata
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor dynamic sensor
Patent number
6,848,306
Issue date
Feb 1, 2005
Denso Corporation
Tomohito Kunda
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Semiconductor acceleration sensor
Patent number
6,448,624
Issue date
Sep 10, 2002
Denso Corporation
Seiichiro Ishio
G01 - MEASURING TESTING
Information
Patent Grant
Surface mount type unit and transducer assembly using same
Patent number
6,060,780
Issue date
May 9, 2000
Denson Corporation
Tameharu Ohta
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Pressure sensor
Publication number
20060053894
Publication date
Mar 16, 2006
DENSO Corporation
Tomohito Kunda
G01 - MEASURING TESTING
Information
Patent Application
Method for manufacturing electronic device including package
Publication number
20050062067
Publication date
Mar 24, 2005
Tomohito Kunda
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Physical quantity sensor capable of outputting time-serial signal i...
Publication number
20040177691
Publication date
Sep 16, 2004
Tomohito Kunda
B60 - VEHICLES IN GENERAL
Information
Patent Application
Capacitive-type acceleration sensor
Publication number
20040020291
Publication date
Feb 5, 2004
Takashi Katsumata
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor dynamic sensor and method of manufacturing the same
Publication number
20010055836
Publication date
Dec 27, 2001
Tomohito Kunda
B81 - MICRO-STRUCTURAL TECHNOLOGY