Tomokazu Shimakura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample holder, charged particle beam apparatus, and observation method
- Patent number 9,773,640
- Issue date Sep 26, 2017
- Hitachi, Ltd.
- Tomokazu Shimakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus sample holder with magnetic field g...
- Patent number 9,070,532
- Issue date Jun 30, 2015
- Hitachi, Ltd.
- Akira Sugawara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 8,766,185
- Issue date Jul 1, 2014
- Hitachi, Ltd.
- Tomokazu Shimakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 8,410,438
- Issue date Apr 2, 2013
- Hitachi, Ltd.
- Tomokazu Shimakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation system and method of measuring a quantitative magnetic f...
- Patent number 6,879,152
- Issue date Apr 12, 2005
- Hitachi, Ltd.
- Tomokazu Shimakura
- G01 - MEASURING TESTING
Information Patent Grant
Method and instrument for measuring a magnetic field, a method for...
- Patent number 6,744,249
- Issue date Jun 1, 2004
- Hitachi, Ltd.
- Hiroshi Suzuki
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE HOLDER, CHARGED PARTICLE BEAM APPARATUS, AND OBSERVATION METHOD
- Publication number 20160035535
- Publication date Feb 4, 2016
- Hitachi, Ltd.
- Tomokazu SHIMAKURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER AND CHARGED PARTICLE BEAM APPARATUS USING SAME
- Publication number 20140319371
- Publication date Oct 30, 2014
- Akira Sugawara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20110284746
- Publication date Nov 24, 2011
- Hitachi, Ltd
- Tomokazu SHIMAKURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20100181480
- Publication date Jul 22, 2010
- Hitachi, Ltd
- Tomokazu SHIMAKURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN
- Publication number 20070194230
- Publication date Aug 23, 2007
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect inspection system and method for recording media
- Publication number 20070057666
- Publication date Mar 15, 2007
- Tomokazu Shimakura
- G01 - MEASURING TESTING
Information Patent Application
Property evaluating system and method for magnetic material
- Publication number 20030214285
- Publication date Nov 20, 2003
- Tomokazu Shimakura
- G01 - MEASURING TESTING
Information Patent Application
Method and instrument for measuring a magnetic field, a method for...
- Publication number 20030042899
- Publication date Mar 6, 2003
- Hitachi, Ltd.
- Hiroshi Suzuki
- G01 - MEASURING TESTING

Tomokazu Shimakura

Person

Patents Grantslast 30 patents

Sample holder, charged particle beam apparatus, and observation method

Charged particle beam apparatus sample holder with magnetic field g...

Charged particle beam device

Charged particle beam device

Evaluation system and method of measuring a quantitative magnetic f...

Method and instrument for measuring a magnetic field, a method for...

Patents Applicationslast 30 patents

SAMPLE HOLDER, CHARGED PARTICLE BEAM APPARATUS, AND OBSERVATION METHOD

SAMPLE HOLDER AND CHARGED PARTICLE BEAM APPARATUS USING SAME

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN

Defect inspection system and method for recording media

Property evaluating system and method for magnetic material

Method and instrument for measuring a magnetic field, a method for...