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Tomonori Ohno
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Yokosuka, JP
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Patents Grants
last 30 patents
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Patent Grant
Method of controlling IC handler and control system using the same
Patent number
6,690,284
Issue date
Feb 10, 2004
Daito Corporation
Tomonori Ohno
G01 - MEASURING TESTING
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Patent Grant
Method of controlling IC handler and control system using the same
Patent number
6,384,734
Issue date
May 7, 2002
Daito Corporation
Tomonori Ohno
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method of controlling IC handler and control system using the same
Publication number
20020080041
Publication date
Jun 27, 2002
Tomonori Ohno
G01 - MEASURING TESTING