Claims
- 1. A method of controlling a test hand for pressing down an IC loaded in the socket of an IC handler, comprising the steps of:
causing said test hand to press down the IC on the socket more than once and detecting the load, the acceleration or velocity, and the thrusting displacement of the IC by corresponding sensors; calculating the combined spring constant for the IC and socket from the measured data items beforehand; and determining the operation of the test hand from the calculated spring constant so that the impact force exerted on the IC is controlled to be equal to or smaller than an allowed value.
- 2. A method of controlling an IC handler comprising the steps of:
comparing a pushing pressure developing when the pusher of a test hand presses an IC placed on a socket with a preset allowable press force; and controlling the operation of the test hand at a press force equal to or lower than said allowable press force on the basis of the result of the comparison.
- 3. The method of controlling an IC handler according to claim 2, further comprising the step of calculating said preset allowable press force from the combined spring constant for the socket and IC beforehand.
- 4. The method of controlling an IC handler according to claim 2, further comprising the step of controlling said pusher in such a manner that the operating speed of said pusher is constant before and after said pusher comes into contact with the IC on said socket.
- 5. The method of controlling an IC handler according to claim 3, wherein the step of calculating the allowable press force from the combined spring constant for said socket and IC includes the step of taking the average of the combined spring constants obtained by causing said pusher to press the IC on said socket more than once.
- 6. An instrumentation control system for a test hand comprising:
a load sensor for detecting the press force of the test hand applied to an IC; an acceleration sensor for detecting the operating velocity or acceleration of said test hand; a displacement sensor for measuring the thrusting displacement during the time from when said test hand comes into contact with the IC until it stops; and control means for not only calculating the combined spring constant for the IC and a socket on the basis of the data items from the individual sensors, but also controlling the driving of the test hand on the basis of the individual data items so that the press force, velocity, and displacement may reach such values that make the impact force acting on the IC equal to or smaller than an allowed value and speed up the operation of the test hand to the maximum.
- 7. The instrumentation control system according to claim 6, wherein said control means has a memory for storing the working velocity of the test hand, the braking position and stop position of the test hand, and the working velocity of the test hand after braking, the allowable thrusting displacement, and the allowable press force as initial conditions beforehand.
- 8. The instrumentation control system according to claim 6, wherein said allowed value is calculated by said control means from the thrusting displacement of the IC and said combined spring constant.
- 9. The instrumentation control system according to claim 8, further comprising means for moving said test hand to said braking position at high speed and, from said braking position on, moving said test hand at low speed.
- 10. The instrumentation control system according to claim 6, further comprising a monitor for displaying the contents of control performed by said control means.
- 11. The instrumentation control system according to claim 7, further comprising means for comparing said set initial conditions with the measured data items from said individual sensors and means for correcting said initial conditions when the result of the comparison has shown that said measured data items differ from said initial conditions.
- 12. A method of controlling an IC handler that executes a test by pressing down an IC loaded on a test hand against a contactor formed of conductive elastic materials which induces conductivity in a state of being compressed, comprising:
storing an amount of initial deformation of said contactor; measuring the amount of residual deformation of said contactor for each test operation; and giving a warning signal for replacing said contactor when the difference between the amount of initial deformation and the amount of residual deformation becomes nearly equal to the allocated allowable amount of deformation.
- 13. The controlling method according to claim 12, wherein said the amount of deformation is calculated in accordance with the difference between a position where a test hand exists when said contactor comes into contact with an IC and a predetermined contact position.
- 14. A method of controlling an IC handler that executes a test by pressing down an IC loaded on a test hand against a contactor formed of conductive elastic materials which induces conductivity in a state of being compressed, comprising:
moving an IC loaded on said test hand at a high speed to a contactor installed on a socket; changing the moving speed of said IC to a low speed when said IC comes into contact with the contactor; detecting a position of a test hand when the IC comes into contact with said contactor; calculating an amount of residual deformation of said contactor from a predetermined initial contact position and said detected position; comparing the amount of the residual deformation with the allocated allowable amount of residual deformation; and executing an IC test by using said contactor while stopping the movement of the IC when the IC is pressed down by the contactor with a predetermined pressure.
- 15. A method of controlling an IC handler that executes a test by pressing down an IC loaded on a test hand against a contactor formed of conductive elastic materials which induces conductivity in a state of being compressed, comprising:
recording an allowable value of reaction force in pressing the IC to the contactor installed on the socket of said IC handler; recording an allowable amount of thrusting displacement of the IC to the contactor on said socket; and controlling reaction force at a time of pressing the IC loaded on said test hand down to the contactor and the amount of thrusting displacement to be equal to or lower than said recorded allowable amount.
- 16. A method of monitoring a performance of a contactor in executing a test by pressing down an IC loaded on a test hand against the contactor formed of conductive elastic materials which induces conductivity in a state of being compressed, comprising:
detecting a position of a test hand at the time when the IC comes into contact with said contactor that is not in a compressed state; calculating an amount of residual deformation of said contactor from a predetermined initial contact position and said detected position; and giving a warning signal when the amount of residual deformation becomes nearly equal to the allocated allowable amount of deformation.
- 17. A recording medium used in the controlling method according to claim 15, wherein said recording medium records at least one of data denoting an allowable press force and data denoting an allowable thrusting displacement of the test hand, which are determined in accordance with the sorts of contactors to be used and ICs to be tested.
- 18. A controlling system of an IC handler that executes a test by pressing down an IC loaded on a test hand against a contactor formed of conductive elastic materials which induces conductivity in a state of being compressed, comprising:
a position sensor which detects a position of the test hand at the time when the IC comes into contact with said contactor that is not in a compressed state; a computing circuit which calculates the amount of residual deformation of said contactor from a predetermined initial contact position and said detected position; and a control circuit which executes an IC test by using said contactor up to the amount of this residual deformation becomes nearly equal to the allocated amount of allowable residual deformation.
- 19. A controlling system of an IC handler that executes a test by pressing down an IC loaded on a test hand against a contactor formed of conductive elastic materials which induces conductivity in a state of being compressed, comprising:
means for moving an IC loaded on said test hand at high speed to a contactor installed on a socket; means for changing the moving speed of said IC to low speed when said IC comes into contact with the contactor; means for detecting a position of a test hand when the IC comes into contact with said contactor; a calculating unit which calculates the amount of residual deformation of said contactor from a predetermined initial contact position and said detected position; means for comparing the amount of this residual deformation with the allocated allowable amount of residual deformation; and means for executing an IC test by using said contactor while stopping the movement of the IC when the IC is pressed down by the contactor with a predetermined pressure.
- 20. A controlling system of an IC handler that executes a test by pressing down an IC loaded on a test hand against a contactor formed of conductive elastic materials which induces conductivity in a state of being compressed, comprising:
means for recording an allowable value of reaction force in pressing the IC to the contactor installed on the socket of said IC handler; means for recording an allowable value of an allowable amount of thrusting displacement of the IC to the contactor of said socket; and means for controlling reaction force at the time of pressing the IC loaded on said test hand down to the contactor and the amount of thrusting displacement to be equal to or lower than said recorded allowable value.
- 21. A system of monitoring the performance of a contactor in executing a test by pressing down an IC loaded on a test hand against the contactor formed of conductive elastic materials which induces conductivity in a state of being compressed, comprising:
means for detecting a position of a test hand at the time when the IC comes into contact with said contactor that is not in a compressed state; means for calculating the amount of residual deformation of said contactor from a predetermined initial contact position and said detected position; and means for giving an alarm when the amount of residual deformation becomes nearly equal to the allocated allowable amount of deformation.
- 22. A controlling system of an IC handler for executing a test by pressing down an IC loaded on a test hand against a contactor formed of conductive elastic materials which induces conductivity in a state of being compressed, comprising:
a loading sensor for detecting the press force of the test hand applied to an IC; a displacement sensor for determining a position at the time when said test hand comes into contact with the IC and for measuring the thrusting displacement during the time from when said test hand comes into contact with the IC until it stops; and control means for not only monitoring whether the press force applying to the IC on the basis of data supplied from said loading sensor and displacement sensor is within the allowable pressure value and allowable amount of displacement, but also controlling the driving of the test hand on the basis of the individual data items.
Priority Claims (2)
Number |
Date |
Country |
Kind |
10-378549 |
Dec 1998 |
JP |
|
PCT/JP99/07413 |
Dec 1999 |
JP |
|
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This is a Continuation-in-part of application Ser. No. 09/651,572, filed Aug. 28, 2000 which is a Continuation of Application PCT/JP99/07413, filed Dec. 28, 1999.
[0002] This application is based upon and claims the benefit of priority from the prior Japanese Patent Application No. 10-378549, filed Dec. 31, 1998, the entire contents of which are incorporated herein by reference.
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
09651572 |
Aug 2000 |
US |
Child |
10084500 |
Feb 2002 |
US |