Tomoyuki Maekawa

Person

Fujisawa-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and semiconductor integrated circu...
- Patent number 10,401,430
- Issue date Sep 3, 2019
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical disk recording device which detects pre-pit distribution an...
- Patent number 8,064,310
- Issue date Nov 22, 2011
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical disc apparatus and ADIP decoder
- Patent number 7,835,244
- Issue date Nov 16, 2010
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Error correction device of optical disk unit
- Patent number 7,613,983
- Issue date Nov 3, 2009
- Kabushiki Kaisha Toshiba
- Katsutoshi Moriyama
- G11 - INFORMATION STORAGE
Information Patent Grant
EEPROM memory card device having defect relieving means
- Patent number 6,161,195
- Issue date Dec 12, 2000
- Kabushiki Kaisha Toshiba
- Kazuo Konishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory card apparatus including a link table for managing the corre...
- Patent number 5,745,912
- Issue date Apr 28, 1998
- Kabushiki Kaisha Toshiba
- Kazuo Konishi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD FOR SEMICONDUCTOR...
- Publication number 20240329132
- Publication date Oct 3, 2024
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND FAILURE DIAGNOSIS METHOD
- Publication number 20190285696
- Publication date Sep 19, 2019
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCU...
- Publication number 20180275198
- Publication date Sep 27, 2018
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND TEST METHOD OF THE SAME
- Publication number 20160072511
- Publication date Mar 10, 2016
- Kabushiki Kaisha Toshiba
- Tomoyuki MAEKAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR SELF TEST OF SEMICO...
- Publication number 20140289576
- Publication date Sep 25, 2014
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR RECORDING DATA IN AN OPTICAL DISC
- Publication number 20110299368
- Publication date Dec 8, 2011
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G11 - INFORMATION STORAGE
Information Patent Application
DESCRAMBLING CIRCUIT, ERROR DETECTION CODE CALCULATING CIRCUIT AND...
- Publication number 20090052658
- Publication date Feb 26, 2009
- Kabushiki Kaisha Toshiba
- Kunihiko Kodama
- G11 - INFORMATION STORAGE
Information Patent Application
OPTICAL DISC APPARATUS AND ADIP DECODER
- Publication number 20080181078
- Publication date Jul 31, 2008
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G11 - INFORMATION STORAGE
Information Patent Application
OPTICAL DISK RECORDING DEVICE
- Publication number 20070297298
- Publication date Dec 27, 2007
- Kabushiki Kaisha Toshiba
- Tomoyuki Maekawa
- G11 - INFORMATION STORAGE
Information Patent Application
Error correction device of optical disk unit
- Publication number 20070011582
- Publication date Jan 11, 2007
- KABUSHIKI KAISHA TOSHIBA
- Katsutoshi Moriyama
- G11 - INFORMATION STORAGE

Tomoyuki Maekawa

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit and semiconductor integrated circu...

Optical disk recording device which detects pre-pit distribution an...

Optical disc apparatus and ADIP decoder

Error correction device of optical disk unit

EEPROM memory card device having defect relieving means

Memory card apparatus including a link table for managing the corre...

Patents Applicationslast 30 patents

SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD FOR SEMICONDUCTOR...

SEMICONDUCTOR DEVICE AND FAILURE DIAGNOSIS METHOD

SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCU...

SEMICONDUCTOR DEVICE AND TEST METHOD OF THE SAME

SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR SELF TEST OF SEMICO...

SYSTEM FOR RECORDING DATA IN AN OPTICAL DISC

DESCRAMBLING CIRCUIT, ERROR DETECTION CODE CALCULATING CIRCUIT AND...

OPTICAL DISC APPARATUS AND ADIP DECODER

OPTICAL DISK RECORDING DEVICE

Error correction device of optical disk unit