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Tooru Takahashi
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Tokyo, JP
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last 30 patents
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Patent Grant
Liquid crystal panel inspection method
Patent number
5,394,481
Issue date
Feb 28, 1995
Ezel Inc.
Ryohei Kumagai
G01 - MEASURING TESTING
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Patent Grant
Liquid crystal panel inspection method
Patent number
5,339,093
Issue date
Aug 16, 1994
Ezel, Inc.
Eryohei Kumagai
G01 - MEASURING TESTING
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Patent Grant
Printed matter inspection method
Patent number
5,321,769
Issue date
Jun 14, 1994
Ezel, Inc.
Tooru Takahashi
G06 - COMPUTING CALCULATING COUNTING