Mandeville, J., "Novel Method for Analysis of Printed Circuit Images", IBM Journal of Research and Development, vol. 29, No. 1, Jan. 1985, Armonk, N.Y., pp. 73-86. |
Darwish, et al., "A Rule Based Approach for Visual Pattern Inspection", IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 10, (1988) Jan., No. 1, New York, N.Y., pp. 56-68. |
Chin, et al., "Automated Visual Inspection: A Survey", IEEE Transaction on Pattern Analysis and Machine Intelligence, vol. PAMI-4 (1982) No. 6, New York, N.Y., pp. 557-573. |