Toru Taura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Antenna device
- Patent number 9,472,855
- Issue date Oct 18, 2016
- NEC Corporation
- Hiroshi Toyao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structural body and interconnect substrate
- Patent number 9,456,499
- Issue date Sep 27, 2016
- NEC Corporation
- Hiroshi Toyao
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Slot antenna
- Patent number 9,166,300
- Issue date Oct 20, 2015
- NEC Corporation
- Toru Taura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Slot antenna, electronic apparatus, and method for manufacturing sl...
- Patent number 8,982,003
- Issue date Mar 17, 2015
- NEC Corporation
- Toru Taura
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Transmission method, interface circuit, semiconductor device, semic...
- Patent number 8,190,086
- Issue date May 29, 2012
- NEC Corporation
- Hideki Sasaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit board device, wiring board interconnection method, and circ...
- Patent number 8,144,482
- Issue date Mar 27, 2012
- NEC Corporation
- Junya Sato
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device for implementing signal transmission and/or po...
- Patent number 7,906,846
- Issue date Mar 15, 2011
- NEC Corporation
- Shigeki Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device testing apparatus and power supply unit for se...
- Patent number 7,852,101
- Issue date Dec 14, 2010
- NEC Corporation
- Michinobu Tanioka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus having a contact sheet and p...
- Patent number 6,486,688
- Issue date Nov 26, 2002
- NEC Corporation
- Toru Taura
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating probe tip portion composed by coaxial cable
- Patent number 6,400,168
- Issue date Jun 4, 2002
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Longitudinal type high frequency probe for narrow pitched electrodes
- Patent number 6,310,483
- Issue date Oct 30, 2001
- NEC Corporation
- Toru Taura
- G01 - MEASURING TESTING
Information Patent Grant
Tip portion structure of high-frequency probe and method for fabric...
- Patent number 6,281,691
- Issue date Aug 28, 2001
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency probe capable of adjusting characteristic impedance...
- Patent number 6,242,930
- Issue date Jun 5, 2001
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing high frequency multichip module enabling...
- Patent number 6,229,321
- Issue date May 8, 2001
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Test method and apparatus of sequentially executing synchronous sig...
- Patent number 5,614,944
- Issue date Mar 25, 1997
- NEC Corporation
- Toru Taura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
ANTENNA DEVICE
- Publication number 20150029068
- Publication date Jan 29, 2015
- NEC Corporation
- Hiroshi Toyao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SLOT ANTENNA
- Publication number 20150009082
- Publication date Jan 8, 2015
- NEC Corporation
- Toru Taura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTENNA APPARATUS AND PORTABLE WIRELESS DEVICE EQUIPPED WITH THE SAME
- Publication number 20150009093
- Publication date Jan 8, 2015
- NEC Corporation
- Toru Taura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SLOT ANTENNA
- Publication number 20130271333
- Publication date Oct 17, 2013
- Toru Taura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURAL BODY AND INTERCONNECT SUBSTRATE
- Publication number 20130140071
- Publication date Jun 6, 2013
- Hiroshi Toyao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOBILE WIRELESS TERMINAL
- Publication number 20120162040
- Publication date Jun 28, 2012
- Toru Taura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SLOT ANTENNA, ELECTRONIC APPARATUS, AND METHOD FOR MANUFACTURING SL...
- Publication number 20120007783
- Publication date Jan 12, 2012
- Toru Taura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SLOT ANTENNA
- Publication number 20100289713
- Publication date Nov 18, 2010
- Toru Taura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SLOT ANTENNA AND PORTABLE WIRELESS TERMINAL
- Publication number 20100225544
- Publication date Sep 9, 2010
- Toru Taura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SLOT ANTENNA
- Publication number 20100207835
- Publication date Aug 19, 2010
- Toru Taura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090278246
- Publication date Nov 12, 2009
- NEC CORPORATION
- Shigeki Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION METHOD, INTERFACE CIRCUIT, SEMICONDUCTOR DEVICE, SEMIC...
- Publication number 20090233546
- Publication date Sep 17, 2009
- NEC CORPORATION
- Hideki Sasaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SLOT ANTENNA AND PORTABLE WIRELESS TERMINAL
- Publication number 20090231215
- Publication date Sep 17, 2009
- Toru Taura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit board device, wiring board interconnection method, and circ...
- Publication number 20090135573
- Publication date May 28, 2009
- Junya Sato
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Semiconductor Device Testing Apparatus and Power Supply Unit
- Publication number 20080265933
- Publication date Oct 30, 2008
- NEC Corporation
- Michinobu Tanioka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus
- Publication number 20020036514
- Publication date Mar 28, 2002
- NEC Corporation
- Toru Taura
- G01 - MEASURING TESTING
Information Patent Application
Method for fabricating probe tip portion composed by coaxial cable
- Publication number 20010038294
- Publication date Nov 8, 2001
- Kouji Matsunaga
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Antenna device

Structural body and interconnect substrate

Slot antenna

Slot antenna, electronic apparatus, and method for manufacturing sl...

Transmission method, interface circuit, semiconductor device, semic...

Circuit board device, wiring board interconnection method, and circ...

Semiconductor device for implementing signal transmission and/or po...

Semiconductor device testing apparatus and power supply unit for se...

Semiconductor device testing apparatus having a contact sheet and p...

Method for fabricating probe tip portion composed by coaxial cable

Longitudinal type high frequency probe for narrow pitched electrodes

Tip portion structure of high-frequency probe and method for fabric...

High-frequency probe capable of adjusting characteristic impedance...

Process for manufacturing high frequency multichip module enabling...

Test method and apparatus of sequentially executing synchronous sig...

Patents Applicationslast 30 patents

ANTENNA DEVICE

SLOT ANTENNA

ANTENNA APPARATUS AND PORTABLE WIRELESS DEVICE EQUIPPED WITH THE SAME

SLOT ANTENNA

STRUCTURAL BODY AND INTERCONNECT SUBSTRATE

MOBILE WIRELESS TERMINAL

SLOT ANTENNA, ELECTRONIC APPARATUS, AND METHOD FOR MANUFACTURING SL...

SLOT ANTENNA

SLOT ANTENNA AND PORTABLE WIRELESS TERMINAL

SLOT ANTENNA

SEMICONDUCTOR DEVICE

TRANSMISSION METHOD, INTERFACE CIRCUIT, SEMICONDUCTOR DEVICE, SEMIC...

SLOT ANTENNA AND PORTABLE WIRELESS TERMINAL

Circuit board device, wiring board interconnection method, and circ...

Semiconductor Device Testing Apparatus and Power Supply Unit

Semiconductor device testing apparatus

Method for fabricating probe tip portion composed by coaxial cable