Toshiaki Awaji

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Differential signal transmitting apparatus and a test apparatus
- Patent number 7,965,092
- Issue date Jun 21, 2011
- Advantest Corporation
- Takayuki Nakamura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Driver circuit and test apparatus
- Patent number 7,962,110
- Issue date Jun 14, 2011
- Advantest Corporation
- Kensuke Kamo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus, pin electronics card, electrical device and switch
- Patent number 7,876,120
- Issue date Jan 25, 2011
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit and test apparatus
- Patent number 7,755,377
- Issue date Jul 13, 2010
- Advantest Corporation
- Kensuke Kamo
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method with features of adjusting phase dif...
- Patent number 7,707,484
- Issue date Apr 27, 2010
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit and test apparatus
- Patent number 7,589,549
- Issue date Sep 15, 2009
- Advantest Corporation
- Kensuke Kamo
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device, circuit and test apparatus
- Patent number 7,557,561
- Issue date Jul 7, 2009
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit, test apparatus and adjusting method
- Patent number 7,538,582
- Issue date May 26, 2009
- Advantest Corporation
- Naoki Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 7,512,872
- Issue date Mar 31, 2009
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Terminator circuit, test apparatus, test head, and communication de...
- Patent number 7,459,897
- Issue date Dec 2, 2008
- Advantest Corporation
- Toshiaki Awaji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test device and setting method
- Patent number 7,453,932
- Issue date Nov 18, 2008
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for testing a device under test and comparator ci...
- Patent number 7,389,190
- Issue date Jun 17, 2008
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Grant
Sampling circuit
- Patent number 7,208,982
- Issue date Apr 24, 2007
- Advantest Corporation
- Masahiro Yamakawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Differential comparator circuit, test head, and test apparatus
- Patent number 7,123,025
- Issue date Oct 17, 2006
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Connector
- Patent number 6,257,933
- Issue date Jul 10, 2001
- Advantest Corporation
- Toshiaki Awaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Driver circuit for semiconductor test system
- Patent number 5,699,001
- Issue date Dec 16, 1997
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit for semiconductor test system
- Patent number 5,654,655
- Issue date Aug 5, 1997
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIFFERENTIAL SIGNAL TRANSMITTING APPARATUS AND A TEST APPARATUS
- Publication number 20100001776
- Publication date Jan 7, 2010
- Advantest Corporation
- TAKAYUKI NAKAMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DRIVER CIRCUIT AND TEST APPARATUS
- Publication number 20090209210
- Publication date Aug 20, 2009
- ADVANTEST CORPORATION
- Kensuke Kamo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20090158103
- Publication date Jun 18, 2009
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus, pin electronics card, electrical device and switch
- Publication number 20090134900
- Publication date May 28, 2009
- Advantest Corporation
- TOSHIAKI AWAJI
- G01 - MEASURING TESTING
Information Patent Application
DRIVER CIRCUIT AND TEST APPARATUS
- Publication number 20090128181
- Publication date May 21, 2009
- Advantest Corporation
- Kensuke Kamo
- G01 - MEASURING TESTING
Information Patent Application
DRIVER CIRCUIT AND TEST APPARATUS
- Publication number 20090128182
- Publication date May 21, 2009
- Advantest Corporation
- Kensuke Kamo
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus and test method
- Publication number 20080120059
- Publication date May 22, 2008
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE, CIRCUIT AND TEST APPARATUS
- Publication number 20070262800
- Publication date Nov 15, 2007
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Application
Terminator circuit, test apparatus, test head, and communication de...
- Publication number 20070257658
- Publication date Nov 8, 2007
- Advantest Corporation
- Toshiaki Awaji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Driver circuit, test apparatus and adjusting method
- Publication number 20070103198
- Publication date May 10, 2007
- Advantest Corporation
- Naoki Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Calibration comparator circuit
- Publication number 20060267637
- Publication date Nov 30, 2006
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Application
Sampling circuit
- Publication number 20060097898
- Publication date May 11, 2006
- Advantest Corporation
- Masahiro Yamakawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Differential comparator circuit, test head, and test apparatus
- Publication number 20060033509
- Publication date Feb 16, 2006
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Application
Test device and setting method
- Publication number 20050243906
- Publication date Nov 3, 2005
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING

Toshiaki Awaji

Person

Patents Grantslast 30 patents

Differential signal transmitting apparatus and a test apparatus

Driver circuit and test apparatus

Test apparatus, pin electronics card, electrical device and switch

Driver circuit and test apparatus

Test apparatus and test method with features of adjusting phase dif...

Driver circuit and test apparatus

Electronic device, circuit and test apparatus

Driver circuit, test apparatus and adjusting method

Test apparatus and test method

Terminator circuit, test apparatus, test head, and communication de...

Test device and setting method

Testing apparatus for testing a device under test and comparator ci...

Sampling circuit

Differential comparator circuit, test head, and test apparatus

Connector

Driver circuit for semiconductor test system

Driver circuit for semiconductor test system

Patents Applicationslast 30 patents

DIFFERENTIAL SIGNAL TRANSMITTING APPARATUS AND A TEST APPARATUS

DRIVER CIRCUIT AND TEST APPARATUS

TEST APPARATUS AND TEST METHOD

Test apparatus, pin electronics card, electrical device and switch

DRIVER CIRCUIT AND TEST APPARATUS

DRIVER CIRCUIT AND TEST APPARATUS

Test apparatus and test method

ELECTRONIC DEVICE, CIRCUIT AND TEST APPARATUS

Terminator circuit, test apparatus, test head, and communication de...

Driver circuit, test apparatus and adjusting method

Calibration comparator circuit

Sampling circuit

Differential comparator circuit, test head, and test apparatus

Test device and setting method