Toshiaki Yanokura

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Mito, JP

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Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometric device and mass spectrometric device control method
- Patent number 9,721,773
- Issue date Aug 1, 2017
- Hitachi High-Technologies Corporation
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam scanning method and charged particle beam app...
- Patent number 8,338,781
- Issue date Dec 25, 2012
- Hitachi High-Technologies Corporation
- Yuko Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam scanning method and charged particle beam app...
- Patent number 7,935,925
- Issue date May 3, 2011
- Hitachi High-Technologies Corporation
- Yuko Sasaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETRIC DEVICE AND MASS SPECTROMETRIC DEVICE CONTROL METHOD
- Publication number 20160141163
- Publication date May 19, 2016
- Hitachi High-Technologies Corporation
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SCANNING METHOD AND CHARGED PARTICLE BEAM APP...
- Publication number 20110174975
- Publication date Jul 21, 2011
- Hitachi High-Technologies Corporation
- Yuko SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam scanning method and charged particle beam app...
- Publication number 20080073528
- Publication date Mar 27, 2008
- Yuko Sasaki
- H01 - BASIC ELECTRIC ELEMENTS