Toshie Yaguchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmission electron microscope and imaging method
- Patent number 12,183,542
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroki Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen holder and charged particle beam device provided with same
- Patent number 11,177,109
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Specimen holder and charged particle beam device provided with same
- Patent number 11,133,150
- Issue date Sep 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for moving an aperture having pluralit...
- Patent number 10,636,621
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Akinari Hanawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and imaging method
- Patent number 10,535,497
- Issue date Jan 14, 2020
- Hitachi High-Technologies Corporation
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample holder for charged particle...
- Patent number 10,068,745
- Issue date Sep 4, 2018
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and sample observation method
- Patent number 9,754,762
- Issue date Sep 5, 2017
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and electron microscope sample retaining device
- Patent number 9,378,922
- Issue date Jun 28, 2016
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation apparatus, and method for displaying thr...
- Patent number 9,099,281
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and sample holder
- Patent number 8,878,144
- Issue date Nov 4, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holding apparatus for electron microscope, and electron micr...
- Patent number 8,835,847
- Issue date Sep 16, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device and sample holding device for electron beam de...
- Patent number 8,604,429
- Issue date Dec 10, 2013
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing method, image processing system, and X-ray compute...
- Patent number 8,588,499
- Issue date Nov 19, 2013
- Hitachi High-Technologies Corporation
- Takashi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Electric charged particle beam microscope and microscopy
- Patent number 7,863,564
- Issue date Jan 4, 2011
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Standard specimen for a charged particle beam apparatus, specimen p...
- Patent number 7,622,714
- Issue date Nov 24, 2009
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam system and a method of sample preparation and obse...
- Patent number 7,612,337
- Issue date Nov 3, 2009
- Hitachi High-Technologies Corporation
- Yuya Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material characterization system
- Patent number 6,992,286
- Issue date Jan 31, 2006
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Sample heating holder, method of observing a sample and charged par...
- Patent number 6,495,838
- Issue date Dec 17, 2002
- Hitachi, Ltd.
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,898,177
- Issue date Apr 27, 1999
- Hitachi, Ltd.
- Kishio Hidaka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Sample Holder and Analysis System
- Publication number 20240266141
- Publication date Aug 8, 2024
- Hitachi High-Tech Corporation
- Hiroyuki ASAKURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope
- Publication number 20240186103
- Publication date Jun 6, 2024
- Hitachi High-Tech Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope and Imaging Method
- Publication number 20220359153
- Publication date Nov 10, 2022
- Hitachi High-Tech Corporation
- Hiroki KAWAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope and Inspection Method Using Transm...
- Publication number 20220244201
- Publication date Aug 4, 2022
- Hitachi High-Tech Corporation
- Toshie YAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Holder and Charged Particle Beam Device Provided with Same
- Publication number 20190180978
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Toshie YAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND IMAGING METHOD
- Publication number 20190131107
- Publication date May 2, 2019
- Hitachi High-Technologies Corporation
- Hirokazu TAMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20180076004
- Publication date Mar 15, 2018
- Hitachi High-Technologies Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD
- Publication number 20170133195
- Publication date May 11, 2017
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Holder for Charged Particle...
- Publication number 20160217971
- Publication date Jul 28, 2016
- Hitachi High-Technologies Corporation
- Toshie YAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND ELECTRON MICROSCOPE SAMPLE RETAINING DEVICE
- Publication number 20150179396
- Publication date Jun 25, 2015
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDING APPARATUS FOR ELECTRON MICROSCOPE, AND ELECTRON MICR...
- Publication number 20140042318
- Publication date Feb 13, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image Processing Method, Image Processing System, and X-Ray Compute...
- Publication number 20130202180
- Publication date Aug 8, 2013
- Hitachi High-Technologies Corporation
- Takashi Kubo
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE AND SAMPLE HOLDER
- Publication number 20120305769
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Radiation Apparatus, and Method for Displaying Thr...
- Publication number 20120212583
- Publication date Aug 23, 2012
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM DEVICE AND SAMPLE HOLDING DEVICE FOR ELECTRON BEAM DE...
- Publication number 20110303845
- Publication date Dec 15, 2011
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY
- Publication number 20090127474
- Publication date May 21, 2009
- Ruriko TSUNETA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam system and its specimen holder
- Publication number 20080093565
- Publication date Apr 24, 2008
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Standard specimen for a charged particle beam apparatus, specimen p...
- Publication number 20080073521
- Publication date Mar 27, 2008
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Application
Focused ion beam system and a method of sample preparation and obse...
- Publication number 20070187597
- Publication date Aug 16, 2007
- Hitachi High-Technologies Corporation
- Yuya Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Material characterization system
- Publication number 20040183012
- Publication date Sep 23, 2004
- Toshie Yaguchi
- G01 - MEASURING TESTING

Toshie Yaguchi

Person

Patents Grantslast 30 patents

Transmission electron microscope and imaging method

Transmission electron microscope and inspection method using transm...

Specimen holder and charged particle beam device provided with same

Specimen holder and charged particle beam device provided with same

Charged particle beam device for moving an aperture having pluralit...

Electron microscope and imaging method

Charged particle beam device and sample holder for charged particle...

Electron microscope and sample observation method

Electron microscope and electron microscope sample retaining device

Charged particle radiation apparatus, and method for displaying thr...

Electron microscope and sample holder

Sample holding apparatus for electron microscope, and electron micr...

Electron beam device and sample holding device for electron beam de...

Image processing method, image processing system, and X-ray compute...

Electric charged particle beam microscope and microscopy

Standard specimen for a charged particle beam apparatus, specimen p...

Focused ion beam system and a method of sample preparation and obse...

Material characterization system

Sample heating holder, method of observing a sample and charged par...

Electron microscope

Patents Applicationslast 30 patents

Sample Holder and Analysis System

Transmission Electron Microscope

Transmission Electron Microscope and Imaging Method

Transmission Electron Microscope and Inspection Method Using Transm...

Specimen Holder and Charged Particle Beam Device Provided with Same

ELECTRON MICROSCOPE AND IMAGING METHOD

Charged Particle Beam Device and Sample Observation Method

ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

Charged Particle Beam Device and Sample Holder for Charged Particle...

ELECTRON MICROSCOPE AND ELECTRON MICROSCOPE SAMPLE RETAINING DEVICE

SAMPLE HOLDING APPARATUS FOR ELECTRON MICROSCOPE, AND ELECTRON MICR...

Image Processing Method, Image Processing System, and X-Ray Compute...

ELECTRON MICROSCOPE AND SAMPLE HOLDER

Charged Particle Radiation Apparatus, and Method for Displaying Thr...

ELECTRON BEAM DEVICE AND SAMPLE HOLDING DEVICE FOR ELECTRON BEAM DE...

ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY

Charged particle beam system and its specimen holder

Standard specimen for a charged particle beam apparatus, specimen p...

Focused ion beam system and a method of sample preparation and obse...

Material characterization system