TREA

Toshiharu Suzuki

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automated analyzer
    • Patent number 11,340,241
    • Issue date May 24, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,215,627
    • Issue date Jan 4, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kenta Imai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,161,118
    • Issue date Nov 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hiroki Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,041,870
    • Issue date Jun 22, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Yokotsuka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis system
    • Patent number 10,962,559
    • Issue date Mar 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Fumiya Nehashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzing device
    • Patent number 10,921,337
    • Issue date Feb 16, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hiroki Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 10,527,637
    • Issue date Jan 7, 2020
    • Hitachi High-Technologies Corporation
    • Hiroki Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,012,663
    • Issue date Jul 3, 2018
    • Hitachi High-Technologies Corporation
    • Takaaki Hagiwara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 9,977,041
    • Issue date May 22, 2018
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,958,468
    • Issue date May 1, 2018
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,880,182
    • Issue date Jan 30, 2018
    • Hitachi High-Technologies Corporation
    • Hiroki Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Polarized total internal reflection illumination optical system by...
    • Patent number 7,486,440
    • Issue date Feb 3, 2009
    • Japan Science and Technology Agency
    • Masasuke Yoshida
    • G02 - OPTICS

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATED ANALYSIS SYSTEM
    • Publication number 20200278365
    • Publication date Sep 3, 2020
    • Hitachi High-Technologies Corporation
    • Fumiya NEHASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20190361041
    • Publication date Nov 28, 2019
    • Hitachi High-Technologies Corporation
    • Shunsuke SASAKI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20190351419
    • Publication date Nov 21, 2019
    • Hitachi High-Technologies Corporation
    • Hiroki FUJITA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20190011469
    • Publication date Jan 10, 2019
    • Hitachi High-Technologies Corporation
    • Satoshi YOKOTSUKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180246133
    • Publication date Aug 30, 2018
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer and Automated Analysis System
    • Publication number 20180224474
    • Publication date Aug 9, 2018
    • Hitachi High-Technologies Corporation
    • Shunsuke SASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING DEVICE
    • Publication number 20180180637
    • Publication date Jun 28, 2018
    • Hitachi High-Technologies Corporation
    • Hiroki FUJITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20180017588
    • Publication date Jan 18, 2018
    • Hitachi High-Technologies Corporation
    • Hiroki FUJITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170205435
    • Publication date Jul 20, 2017
    • Hitachi High-Technologies Corporation
    • Takaaki HAGIWARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160154016
    • Publication date Jun 2, 2016
    • Hitachi High-Technologies Corporation
    • Yoshihiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160146846
    • Publication date May 26, 2016
    • Hitachi High-Technologies Corporation
    • Hiroki FUJITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20150293135
    • Publication date Oct 15, 2015
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Application

    Polarized Total Internal Reflection Illumination Optical System by...
    • Publication number 20080062513
    • Publication date Mar 13, 2008
    • Masasuke Yoshida
    • G02 - OPTICS