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Toshihide Agemura

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRON BEAM APPLICATION DEVICE
    • Publication number 20240161997
    • Publication date May 16, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Takashi OHSHIMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
    • Publication number 20240120168
    • Publication date Apr 11, 2024
    • Hitachi High-Tech Corporation
    • Takashi Ohshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE
    • Publication number 20230402246
    • Publication date Dec 14, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Hideo MORISHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON GUN AND ELECTRON MICROSCOPE
    • Publication number 20220406558
    • Publication date Dec 22, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hideo MORISHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON BEAM APPARATUS
    • Publication number 20220165536
    • Publication date May 26, 2022
    • Hitachi High-Tech Corporation
    • Takashi Ohshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON BEAM DEVICE
    • Publication number 20220059317
    • Publication date Feb 24, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Minami SHOUJI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20220013326
    • Publication date Jan 13, 2022
    • Hitachi High-Tech Corporation
    • Katsura Takaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SPIN POLARIMETER
    • Publication number 20210074509
    • Publication date Mar 11, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hideo MORISHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON MICROSCOPE
    • Publication number 20200303152
    • Publication date Sep 24, 2020
    • Hitachi High-Technologies Corporation
    • Takashi OHSHIMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING...
    • Publication number 20200294764
    • Publication date Sep 17, 2020
    • Hitachi High-Tech Corporation
    • Katsura Takaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20200273665
    • Publication date Aug 27, 2020
    • Hitachi High-Technologies Corporation
    • Hideo MORISHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20200211815
    • Publication date Jul 2, 2020
    • Hitachi High-Technologies Corporation
    • Tsunenori NOMAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MEASURING APPARATUS AND METHOD OF SETTING OBSERVATION CONDITION
    • Publication number 20200111638
    • Publication date Apr 9, 2020
    • Hitachi High-Technologies Corporation
    • Ryoko ARAKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20200090903
    • Publication date Mar 19, 2020
    • Hitachi High-Technologies Corporation
    • Ryo HIRANO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20190385810
    • Publication date Dec 19, 2019
    • Hitachi High-Technologies Corporation
    • Ryuju SATO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20190148105
    • Publication date May 16, 2019
    • Hitachi High-Technologies Corporation
    • Munekazu KOYANAGI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    COMPOSITE CHARGED PARTICLE BEAM DEVICE
    • Publication number 20180025885
    • Publication date Jan 25, 2018
    • Hitachi High-Technologies Corporation
    • Yuta IMAI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Composite Charged Particle Beam Detector, Charged Particle Beam Dev...
    • Publication number 20170358421
    • Publication date Dec 14, 2017
    • Hitachi High-Technologies Corporation
    • Tsunenori NOMAGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Charged Particle Beam Device and Information-Processing Device
    • Publication number 20170345614
    • Publication date Nov 30, 2017
    • Hitachi High-Technologies Corporation
    • Yoshinobu KIMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    COMPOSITE CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
    • Publication number 20170330722
    • Publication date Nov 16, 2017
    • Hitachi High-Technologies Corporation
    • Toshihide Agemura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning Electron Microscope
    • Publication number 20170309437
    • Publication date Oct 26, 2017
    • Hitachi High-Technologies Corporation
    • Toshihide AGEMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electron Beam Device
    • Publication number 20170040139
    • Publication date Feb 9, 2017
    • Tsunenori NOMAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20160379797
    • Publication date Dec 29, 2016
    • HITACHI HIGH-TECNOLOGIES CORPORATION
    • Tsunenori NOMAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning Electron Microscope
    • Publication number 20160148782
    • Publication date May 26, 2016
    • Hitachi High-Technologies Corporation
    • Toshihide AGEMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Composite Charged Particle Beam Detector, Charged Particle Beam Dev...
    • Publication number 20150364296
    • Publication date Dec 17, 2015
    • Hitachi High-Technologies Corporation
    • Tsunenori NOMAGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Composite Charged Particle Beam Device
    • Publication number 20150221468
    • Publication date Aug 6, 2015
    • Hitachi High-Technologies Corporation
    • Tsunenori Nomaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM APPARATUS
    • Publication number 20150083910
    • Publication date Mar 26, 2015
    • Hitachi High-Technologies Corporation
    • Tsunenori Nomaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM APPARATUS
    • Publication number 20140175279
    • Publication date Jun 26, 2014
    • Hitachi High-Technologies Corporation
    • Toshihide Agemura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20140123898
    • Publication date May 8, 2014
    • Hitachi High-Technologies Corporation
    • Tsunenori Nomaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE AND METHOD OF MANUFACTURE OF SAMPLE
    • Publication number 20130277552
    • Publication date Oct 24, 2013
    • Hitachi High-Technologies Corporation
    • Terutaka Nanri
    • H01 - BASIC ELECTRIC ELEMENTS