Toshihiko Matsumoto

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device for and method of inspecting surface condition having differ...
- Patent number 7,782,451
- Issue date Aug 24, 2010
- Omron Corporation
- Toshihiko Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection system using the method
- Patent number 7,446,864
- Issue date Nov 4, 2008
- Omron Corporation
- Hiroshi Okabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus and image processing method
- Patent number 7,212,672
- Issue date May 1, 2007
- Omron Corporation
- Shiro Fujieda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shading correction method, and apparatus therefor
- Patent number 5,621,824
- Issue date Apr 15, 1997
- Omron Corporation
- Takashi Ijiri
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Defect inspection apparatus and defect inspection method
- Publication number 20070211242
- Publication date Sep 13, 2007
- OMRON CORPORATION
- Hiroshi Okabe
- G01 - MEASURING TESTING
Information Patent Application
Device for and method of inspecting surface condition
- Publication number 20070211240
- Publication date Sep 13, 2007
- OMRON CORPORATION
- Toshihiko Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Defect inspection method and defect inspection system using the method
- Publication number 20060251315
- Publication date Nov 9, 2006
- OMRON CORPORATION
- Hiroshi Okabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image processing apparatus and image processing method
- Publication number 20040131256
- Publication date Jul 8, 2004
- OMRON CORPORATION
- Shiro Fujieda
- G06 - COMPUTING CALCULATING COUNTING