Toshihiro KANEMATSU

Person

Miyazaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
One-dimensional measurement device and program
- Patent number 11,378,378
- Issue date Jul 5, 2022
- Mitutoyo Corporation
- Hideaki Fujihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Form measuring apparatus
- Patent number 11,022,418
- Issue date Jun 1, 2021
- Mitutoyo Corporation
- Toshihiro Kanematsu
- G01 - MEASURING TESTING
Information Patent Grant
Drive control method of drive stage device
- Patent number 10,605,583
- Issue date Mar 31, 2020
- Mitutoyo Corporation
- Hiroomi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus
- Patent number 10,584,981
- Issue date Mar 10, 2020
- Mitutoyo Corporation
- Toshihiko Kajihara
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measurement device, controller for surface texture...
- Patent number 9,151,589
- Issue date Oct 6, 2015
- Mitutoyo Corporation
- Toshihiro Kanematsu
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring instrument and measuring method
- Patent number 8,276,435
- Issue date Oct 2, 2012
- Mitutoyo Corporation
- Toshihiro Kanematsu
- G01 - MEASURING TESTING
Information Patent Grant
Sensor signal circuit and measuring instrument
- Patent number 7,068,026
- Issue date Jun 27, 2006
- Mitutoyo Corporation
- Toshihiro Kanematsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Surface texture measuring machine, leveling device for surface text...
- Patent number 6,745,616
- Issue date Jun 8, 2004
- Mitutoyo Corporation
- Minoru Katayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus
- Patent number 6,510,363
- Issue date Jan 21, 2003
- Mitutoyo Corporation
- Hiroyuki Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus
- Patent number 6,357,286
- Issue date Mar 19, 2002
- Mitutoyo Corporation
- Toshihiro Kanematsu
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DETECTOR DETECTION DEVICE AND MEASURING MACHINE
- Publication number 20240328770
- Publication date Oct 3, 2024
- MITUTOYO CORPORATION
- Takayuki SHIMOJI
- G01 - MEASURING TESTING
Information Patent Application
ONE-DIMENSIONAL MEASUREMENT DEVICE AND PROGRAM
- Publication number 20200249003
- Publication date Aug 6, 2020
- MITUTOYO CORPORATION
- Hideaki FUJIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FORM MEASURING APPARATUS
- Publication number 20200041246
- Publication date Feb 6, 2020
- MITUTOYO CORPORATION
- Toshihiro KANEMATSU
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASURING APPARATUS
- Publication number 20180340798
- Publication date Nov 29, 2018
- Mitutoyo Corporation
- Toshihiko Kajihara
- G01 - MEASURING TESTING
Information Patent Application
DRIVE CONTROL METHOD OF DRIVE STAGE DEVICE
- Publication number 20180299247
- Publication date Oct 18, 2018
- MITUTOYO CORPORATION
- Hiroomi HONDA
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING APPARATUS FOR MEASURING MACHINE
- Publication number 20170093413
- Publication date Mar 30, 2017
- Mitutoyo Corporation
- Toshihiro KANEMATSU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL PROCESSING CIRCUIT FOR MEASURING MACHINE
- Publication number 20170089741
- Publication date Mar 30, 2017
- Mitutoyo Corporation
- Chihiro TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASUREMENT DEVICE, CONTROLLER FOR SURFACE TEXTURE...
- Publication number 20130238281
- Publication date Sep 12, 2013
- MITUTOYO CORPORATION
- Toshihiro KANEMATSU
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASURING INSTRUMENT AND MEASURING METHOD
- Publication number 20100018298
- Publication date Jan 28, 2010
- Mitutoyo Corporation
- Toshihiro Kanematsu
- G01 - MEASURING TESTING
Information Patent Application
Sensor signal circuit and measuring instrument
- Publication number 20050228600
- Publication date Oct 13, 2005
- Mitutoyo Corporation
- Toshihiro Kanematsu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Toshihiro KANEMATSU

Person

Patents Grantslast 30 patents

One-dimensional measurement device and program

Form measuring apparatus

Drive control method of drive stage device

Surface texture measuring apparatus

Surface texture measurement device, controller for surface texture...

Surface texture measuring instrument and measuring method

Sensor signal circuit and measuring instrument

Surface texture measuring machine, leveling device for surface text...

Surface texture measuring apparatus

Surface texture measuring apparatus

Patents Applicationslast 30 patents

DETECTOR DETECTION DEVICE AND MEASURING MACHINE

ONE-DIMENSIONAL MEASUREMENT DEVICE AND PROGRAM

FORM MEASURING APPARATUS

SURFACE TEXTURE MEASURING APPARATUS

DRIVE CONTROL METHOD OF DRIVE STAGE DEVICE

SIGNAL PROCESSING APPARATUS FOR MEASURING MACHINE

SIGNAL PROCESSING CIRCUIT FOR MEASURING MACHINE

SURFACE TEXTURE MEASUREMENT DEVICE, CONTROLLER FOR SURFACE TEXTURE...

SURFACE TEXTURE MEASURING INSTRUMENT AND MEASURING METHOD

Sensor signal circuit and measuring instrument