Toshihiro Yonezawa

Person

Yamanashi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Cantilevered probe having a bending contact
- Patent number 8,674,717
- Issue date Mar 18, 2014
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having a structure for being prevented from deforming
- Patent number 8,415,964
- Issue date Apr 9, 2013
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe device having a structure for being prevented from deforming
- Patent number 8,319,511
- Issue date Nov 27, 2012
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism for fixing probe card
- Patent number RE42655
- Issue date Aug 30, 2011
- Tokyo Electron Limited
- Toshihiro Yonezawa
- 324 - Electricity: measuring and testing
Information Patent Grant
Mechanism for fixing probe card
- Patent number RE42115
- Issue date Feb 8, 2011
- Tokyo Electron Limited
- Toshihiro Yonezawa
- 324 - Electricity: measuring and testing
Information Patent Grant
Probe device and method of regulating contact pressure between obje...
- Patent number 7,847,569
- Issue date Dec 7, 2010
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe and method of manufacturing probe
- Patent number 7,649,369
- Issue date Jan 19, 2010
- Octec Inc.
- Katsuya Okumura
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism for fixing probe card
- Patent number 6,831,455
- Issue date Dec 14, 2004
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum coupling system
- Patent number 6,205,652
- Issue date Mar 27, 2001
- Tokyo Electron Limited
- Toshihiro Yonezawa
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Semiconductor wafer holder with spring-mounted temperature measurem...
- Patent number 6,084,215
- Issue date Jul 4, 2000
- Tokyo Electron Limited
- Kunihiro Furuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for aligning a semiconductor wafer with an inspection con...
- Patent number 5,999,268
- Issue date Dec 7, 1999
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, transportation apparatus, and temperature con...
- Patent number 5,708,222
- Issue date Jan 13, 1998
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE DEVICE
- Publication number 20100301888
- Publication date Dec 2, 2010
- TOKYO ELECTRON LIMITED
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20100301887
- Publication date Dec 2, 2010
- TOKYO ELECTRON LIMITED
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20100277193
- Publication date Nov 4, 2010
- TOKYO ELECTRON LIMITED
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE AND METHOD OF REGULATING CONTACT PRESSURE BETWEEN OBJE...
- Publication number 20090284272
- Publication date Nov 19, 2009
- TOKYO ELECTRON LIMITED
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Application
Probe Card
- Publication number 20080048698
- Publication date Feb 28, 2008
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Probe and Method of Manufacturing Probe
- Publication number 20080036479
- Publication date Feb 14, 2008
- Katsuya Okumura
- G01 - MEASURING TESTING
Information Patent Application
Mechanism for fixing probe card
- Publication number 20040090223
- Publication date May 13, 2004
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Application
Temperature control apparatus
- Publication number 20020014894
- Publication date Feb 7, 2002
- Toshihiro Yonezawa
- G01 - MEASURING TESTING

Toshihiro Yonezawa

Person

Patents Grantslast 30 patents

Cantilevered probe having a bending contact

Probe card having a structure for being prevented from deforming

Probe device having a structure for being prevented from deforming

Mechanism for fixing probe card

Mechanism for fixing probe card

Probe device and method of regulating contact pressure between obje...

Probe and method of manufacturing probe

Mechanism for fixing probe card

Vacuum coupling system

Semiconductor wafer holder with spring-mounted temperature measurem...

Apparatus for aligning a semiconductor wafer with an inspection con...

Inspection apparatus, transportation apparatus, and temperature con...

Patents Applicationslast 30 patents

PROBE DEVICE

PROBE CARD

PROBE

PROBE DEVICE AND METHOD OF REGULATING CONTACT PRESSURE BETWEEN OBJE...

Probe Card

Probe and Method of Manufacturing Probe

Mechanism for fixing probe card

Temperature control apparatus