Toshihisa TANAKA

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Specimen smearing apparatus, specimen smearing method, smear sample...
- Patent number 11,422,072
- Issue date Aug 23, 2022
- Sysmex Corporation
- Shogo Kubota
- G01 - MEASURING TESTING
Information Patent Grant
Specimen smearing apparatus, specimen smearing method, smear sample...
- Patent number 10,801,929
- Issue date Oct 13, 2020
- Sysmex Corporation
- Shogo Kubota
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus, sample rack set, and sample processing...
- Patent number 9,720,009
- Issue date Aug 1, 2017
- Sysmex Corporation
- Toshihisa Tanaka
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN SMEARING APPARATUS, SPECIMEN SMEARING METHOD, SMEAR SAMPLE...
- Publication number 20220357245
- Publication date Nov 10, 2022
- SYSMEX CORPORATION
- Shogo KUBOTA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN SMEARING APPARATUS, SPECIMEN SMEARING METHOD, SMEAR SAMPLE...
- Publication number 20200348214
- Publication date Nov 5, 2020
- SYSMEX CORPORATION
- Shogo KUBOTA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN SMEARING APPARATUS, SPECIMEN SMEARING METHOD, SMEAR SAMPLE...
- Publication number 20180188140
- Publication date Jul 5, 2018
- SYSMEX CORPORATION
- Shogo KUBOTA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS SYSTEM AND SAMPLE ANALYSIS METHOD
- Publication number 20170285052
- Publication date Oct 5, 2017
- SYSMEX CORPORATION
- Hiroo TATSUTANI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS, SAMPLE RACK SET, AND SAMPLE PROCESSING...
- Publication number 20140256050
- Publication date Sep 11, 2014
- SYSMEX CORPORATION
- Toshihisa TANAKA
- G01 - MEASURING TESTING