Toshimasa Yamamoto

Person

Bisai, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Capacitance type physical quantity sensor
- Patent number 7,201,053
- Issue date Apr 10, 2007
- Denso Corporation
- Tetsuo Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Flow sensor having thin film portion and method for manufacturing t...
- Patent number 6,983,653
- Issue date Jan 10, 2006
- Denso Corporation
- Takao Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Fluid flow sensor and method of fabricating the same
- Patent number 6,768,291
- Issue date Jul 27, 2004
- Denso Corporation
- Toshiki Isogai
- G01 - MEASURING TESTING
Information Patent Grant
Flow sensor
- Patent number 6,705,160
- Issue date Mar 16, 2004
- Denso Corporation
- Takao Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Flow sensor
- Patent number 6,701,782
- Issue date Mar 9, 2004
- Denso Corporation
- Takao Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Flow meter having airflow sensor
- Patent number 6,694,811
- Issue date Feb 24, 2004
- Denso Corporation
- Yasushi Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Thermal flow sensor having improved sensing range
- Patent number 6,626,037
- Issue date Sep 30, 2003
- Denso Corporation
- Hiroyuki Wado
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing sensor having membrane structure
- Patent number 6,602,428
- Issue date Aug 5, 2003
- Denso Corporation
- Hiroyuki Wado
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor substrate manufacturing method, semiconductor pressur...
- Patent number 6,388,279
- Issue date May 14, 2002
- Denso Corporation
- Minekazu Sakai
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor physical quantity sensor having movable portion and f...
- Patent number 6,276,207
- Issue date Aug 21, 2001
- Denso Corporation
- Minekazu Sakai
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor physical quantity sensor and production method thereof
- Patent number 6,240,782
- Issue date Jun 5, 2001
- Denso Corporation
- Nobuyuki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor physical-quantity sensor having a locos oxide film, f...
- Patent number 6,137,150
- Issue date Oct 24, 2000
- Nippondenso Co., Ltd.
- Yukihiro Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing dynamic amount semiconductor sensor
- Patent number 6,048,774
- Issue date Apr 11, 2000
- Denso Corporation
- Toshimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor physical quantity sensor
- Patent number 5,987,989
- Issue date Nov 23, 1999
- Denso Corporation
- Toshimasa Yamamoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor sensor having suspended thin-film structure and metho...
- Patent number 5,922,212
- Issue date Jul 13, 1999
- Nippondenso Co., Ltd.
- Kazuhiko Kano
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor acceleration sensor with movable electrode
- Patent number 5,572,057
- Issue date Nov 5, 1996
- Nippondenso Co., Ltd.
- Toshimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor accelerometer
- Patent number 5,504,356
- Issue date Apr 2, 1996
- Nippondenso Co., Ltd.
- Yukihiro Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor yaw rate sensor
- Patent number 5,500,549
- Issue date Mar 19, 1996
- Nippondenso Co., Ltd.
- Yukihiro Takeuchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Capacitance type physical quantity sensor
- Publication number 20040231421
- Publication date Nov 25, 2004
- Tetsuo Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Flow sensor having thin film portion and method for manufacturing t...
- Publication number 20040118202
- Publication date Jun 24, 2004
- Denso Corporation
- Takao Iwaki
- G01 - MEASURING TESTING
Information Patent Application
Flow meter having airflow sensor
- Publication number 20030172731
- Publication date Sep 18, 2003
- Yasushi Kohno
- G01 - MEASURING TESTING
Information Patent Application
Flow sensor
- Publication number 20030019290
- Publication date Jan 30, 2003
- Takao Iwaki
- G01 - MEASURING TESTING
Information Patent Application
Flow sensor
- Publication number 20030015034
- Publication date Jan 23, 2003
- Takao Iwaki
- G01 - MEASURING TESTING
Information Patent Application
Fluid flow sensor and method of fabricating the same
- Publication number 20020148289
- Publication date Oct 17, 2002
- Toshiki Isogai
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing sensor having membrane structure
- Publication number 20020070195
- Publication date Jun 13, 2002
- Hiroyuki Wado
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Toshimasa Yamamoto

Person

Patents Grantslast 30 patents

Capacitance type physical quantity sensor

Flow sensor having thin film portion and method for manufacturing t...

Fluid flow sensor and method of fabricating the same

Flow sensor

Flow sensor

Flow meter having airflow sensor

Thermal flow sensor having improved sensing range

Method of manufacturing sensor having membrane structure

Semiconductor substrate manufacturing method, semiconductor pressur...

Semiconductor physical quantity sensor having movable portion and f...

Semiconductor physical quantity sensor and production method thereof

Semiconductor physical-quantity sensor having a locos oxide film, f...

Method of manufacturing dynamic amount semiconductor sensor

Semiconductor physical quantity sensor

Semiconductor sensor having suspended thin-film structure and metho...

Semiconductor acceleration sensor with movable electrode

Semiconductor accelerometer

Semiconductor yaw rate sensor

Patents Applicationslast 30 patents

Capacitance type physical quantity sensor

Flow sensor having thin film portion and method for manufacturing t...

Flow meter having airflow sensor

Flow sensor

Flow sensor

Fluid flow sensor and method of fabricating the same

Method of manufacturing sensor having membrane structure