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Toshio Kawano
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Osaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of calibrating spectral apparatus and method of producing ca...
Patent number
11,307,093
Issue date
Apr 19, 2022
Konica Minolta, Inc.
Yoshiroh Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Method of calibrating spectral apparatus and method of producing ca...
Patent number
10,768,048
Issue date
Sep 8, 2020
Konica Minolta, Inc.
Yoshiroh Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Reflection characteristic measuring device
Patent number
10,746,650
Issue date
Aug 18, 2020
Konica Minolta, Inc.
Toshio Kawano
G01 - MEASURING TESTING
Information
Patent Grant
Optical unit for multi-angle optical characteristic measuring devic...
Patent number
10,578,546
Issue date
Mar 3, 2020
Konica Minolta, Inc.
Toshio Kawano
G01 - MEASURING TESTING
Information
Patent Grant
Gloss evaluation method and gloss evaluation device
Patent number
10,302,562
Issue date
May 28, 2019
Konica Minolta, Inc.
Toshio Kawano
G01 - MEASURING TESTING
Information
Patent Grant
Fourier transform spectrometer and fourier transform spectroscopic...
Patent number
9,442,014
Issue date
Sep 13, 2016
Konica Minolta, Inc.
Yoshiroh Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional processor and method for controlling display of t...
Patent number
8,121,814
Issue date
Feb 21, 2012
Konica Minolta Sensing, Inc.
Yoshihisa Abe
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional position measurement method and apparatus used fo...
Patent number
7,502,100
Issue date
Mar 10, 2009
Konica Minolta Sensing, Inc.
Toshio Kawano
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF CALIBRATING SPECTRAL APPARATUS AND METHOD OF PRODUCING CA...
Publication number
20200363262
Publication date
Nov 19, 2020
Konica Minolta Inc.
Yoshiroh NAGAI
G01 - MEASURING TESTING
Information
Patent Application
Method Of Calibrating Spectroscopic Apparatus And Method Of Produci...
Publication number
20200088575
Publication date
Mar 19, 2020
Konica Minolta, Inc.
Yoshiroh NAGAI
G01 - MEASURING TESTING
Information
Patent Application
Reflection Characteristic Measuring Device
Publication number
20190285540
Publication date
Sep 19, 2019
Konica Minolta, Inc.
Toshio KAWANO
G01 - MEASURING TESTING
Information
Patent Application
Optical Unit For Multi-Angle Optical Characteristic Measuring Devic...
Publication number
20190195783
Publication date
Jun 27, 2019
Konica Minolta ,Inc.
Toshio KAWANO
G01 - MEASURING TESTING
Information
Patent Application
Gloss Evaluation Method And Gloss Evaluation Device
Publication number
20160258865
Publication date
Sep 8, 2016
KONICA MINOLTA, INC.
Toshio KAWANO
G01 - MEASURING TESTING
Information
Patent Application
FOURIER TRANSFORM SPECTROMETER AND FOURIER TRANSFORM SPECTROSCOPIC...
Publication number
20140022546
Publication date
Jan 23, 2014
Konica Minolta, Inc.
Yoshiroh Nagai
G01 - MEASURING TESTING
Information
Patent Application
Three-dimensional processor and method for controlling display of t...
Publication number
20090201292
Publication date
Aug 13, 2009
KONICA MINOLTA SENSING, INC.
Yoshihisa Abe
G01 - MEASURING TESTING
Information
Patent Application
Three-dimensional position measurement method and apparatus used fo...
Publication number
20060274329
Publication date
Dec 7, 2006
KONICA MINOLTA SENSING, INC.
Toshio Kawano
G01 - MEASURING TESTING
Information
Patent Application
Three-dimensional shape measuring apparatus
Publication number
20030058455
Publication date
Mar 27, 2003
Akimitsu Ebihara
G01 - MEASURING TESTING