Toshiyuki Iwamoto

Person

Hachioji-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method of manufacturing the semiconductor...
- Patent number 8,586,437
- Issue date Nov 19, 2013
- Renesas Electronics Corporation
- Toshiyuki Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device and semiconductor device
- Patent number 8,283,223
- Issue date Oct 9, 2012
- Renesas Electronics Corporation
- Toshiyuki Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid planarFET and FinFET provided on a chip
- Patent number 8,269,271
- Issue date Sep 18, 2012
- Renesas Electronics Corporation
- Toshiyuki Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 8,044,470
- Issue date Oct 25, 2011
- Renesas Electronics Corporation
- Toshiyuki Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having high dielectric constant layers of diff...
- Patent number 7,759,744
- Issue date Jul 20, 2010
- NEC Electronics Corporation
- Naohiko Kimizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,754,570
- Issue date Jul 13, 2010
- NEC Electronics Corporation
- Naohiko Kimizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a high-k film on a semiconductor device
- Patent number 7,718,532
- Issue date May 18, 2010
- NEC Electronics Corporation
- Hiroaki Tomimori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical-path-difference compensation mechanism for acquiring wave f...
- Patent number 7,705,311
- Issue date Apr 27, 2010
- Japan Science and Technology Agency
- Seizi Nishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Infrared light emitting device, infrared light detecting device, ti...
- Patent number 7,615,749
- Issue date Nov 10, 2009
- Japan Science and Technology Agency
- Seizi Nishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical-path-difference compensation mechanism for acquiring wave f...
- Patent number 7,507,966
- Issue date Mar 24, 2009
- Japan Science and Technology Agency
- Seizi Nishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 7,238,996
- Issue date Jul 3, 2007
- NEC Electronics Corporation
- Naohiko Kimizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a high-k film on a semiconductor device
- Patent number 7,192,835
- Issue date Mar 20, 2007
- NEC Electronics Corporation
- Hiroaki Tomimori
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR...
- Publication number 20120315736
- Publication date Dec 13, 2012
- RENESAS ELECTRONICS CORPORATION
- Toshiyuki Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
- Publication number 20100327365
- Publication date Dec 30, 2010
- RENESAS ELECTRONICS CORPORATION
- TOSHIYUKI IWAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the semiconductor...
- Publication number 20100270621
- Publication date Oct 28, 2010
- NEC Electronics Corporation
- Toshiyuki Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20100252888
- Publication date Oct 7, 2010
- NEC ELECTRONICS CORPORATION
- Toshiyuki Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20100224914
- Publication date Sep 9, 2010
- NEC ELECTRONICS CORPORATION
- Toshiyuki IWAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device including MOSFET with controlled threshold vol...
- Publication number 20100133622
- Publication date Jun 3, 2010
- NEC Electronics Corporation
- Toshiyuki Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of fabricating the same
- Publication number 20090289285
- Publication date Nov 26, 2009
- NEC Electronics Corporation
- Toshiyuki Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL-PATH-DIFFERENCE COMPENSATION MECHANISM FOR ACQUIRING WAVE F...
- Publication number 20090152469
- Publication date Jun 18, 2009
- Seizi Nishizawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and production method therefor
- Publication number 20080203500
- Publication date Aug 28, 2008
- NEC Corporation
- Takashi Ogura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming a high-k film on a semiconductor device
- Publication number 20080081445
- Publication date Apr 3, 2008
- NEC ELECTRONICS CORPORATION
- Hiroaki Tomimori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Infrared light emitting device, infrared light detecting device, ti...
- Publication number 20070194253
- Publication date Aug 23, 2007
- Seizi Nishizawa
- G01 - MEASURING TESTING
Information Patent Application
Optical path difference compensation mechanism for acquiring wave f...
- Publication number 20060278830
- Publication date Dec 14, 2006
- Seizi Nishizawa
- G01 - MEASURING TESTING
Information Patent Application
CMOS semiconductor device
- Publication number 20060145265
- Publication date Jul 6, 2006
- Yuri Masuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and production method therefor
- Publication number 20060131670
- Publication date Jun 22, 2006
- Takashi Ogura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20060043497
- Publication date Mar 2, 2006
- NEC ELECTRONICS CORPORATION
- Naohiko Kimizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20050263802
- Publication date Dec 1, 2005
- NEC ELECTRONICS CORPORATION
- Naohiko Kimizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20050253181
- Publication date Nov 17, 2005
- NEC ELECTRONICS CORPORATION
- Naohiko Kimizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20040248350
- Publication date Dec 9, 2004
- NEC ELECTRONIC CORPORATION
- Hiroaki Tomimori
- H01 - BASIC ELECTRIC ELEMENTS

Toshiyuki Iwamoto

Person

Patents Grantslast 30 patents

Semiconductor device and method of manufacturing the semiconductor...

Method of manufacturing semiconductor device and semiconductor device

Hybrid planarFET and FinFET provided on a chip

Semiconductor device and method of fabricating the same

Semiconductor device having high dielectric constant layers of diff...

Semiconductor device

Method of forming a high-k film on a semiconductor device

Optical-path-difference compensation mechanism for acquiring wave f...

Infrared light emitting device, infrared light detecting device, ti...

Optical-path-difference compensation mechanism for acquiring wave f...

Semiconductor device

Method of forming a high-k film on a semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

Semiconductor device and method of manufacturing the semiconductor...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

Semiconductor device including MOSFET with controlled threshold vol...

Semiconductor device and method of fabricating the same

OPTICAL-PATH-DIFFERENCE COMPENSATION MECHANISM FOR ACQUIRING WAVE F...

Semiconductor device and production method therefor

Method of forming a high-k film on a semiconductor device

Infrared light emitting device, infrared light detecting device, ti...

Optical path difference compensation mechanism for acquiring wave f...

CMOS semiconductor device

Semiconductor device and production method therefor

Semiconductor device

Semiconductor device

Semiconductor device

Method for manufacturing semiconductor device