Toshiyuki Nakaie

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Wakayama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Integral value measuring circuit
- Patent number 8,829,972
- Issue date Sep 9, 2014
- Hanwa Electronic Ind. Co., Ltd.
- Toshiyuki Nakaie
- G01 - MEASURING TESTING
Information Patent Grant
Impulse immunity test apparatus
- Patent number 8,410,791
- Issue date Apr 2, 2013
- NEC Corporation
- Tsuneo Tsukagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring characteristic impedance of electrostatic disch...
- Patent number 7,609,076
- Issue date Oct 27, 2009
- Hanwa Electronic Ind. Co., Ltd.
- Toshiyuki Nakaie
- G01 - MEASURING TESTING
Information Patent Grant
CDM simulator
- Patent number 5,740,007
- Issue date Apr 14, 1998
- Hanwa Electronic Ind. Co., Ltd.
- Toshiyuki Nakaie
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for detecting noise in the measurement of very small resi...
- Patent number 4,929,886
- Issue date May 29, 1990
- Hanwa Electronic Co., Ltd.
- Nakaie Toshiyuki
- G01 - MEASURING TESTING
Information Patent Grant
Base board for testing integrated circuits
- Patent number 4,812,755
- Issue date Mar 14, 1989
- Hanwa Electronic Co., Ltd.
- Nakaie Toshiyuki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing integrated circuit
- Patent number 4,677,375
- Issue date Jun 30, 1987
- Hanwa Electronic Co., Ltd.
- Toshiyuki Nakaie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Integral Value Measuring Circuit
- Publication number 20130009628
- Publication date Jan 10, 2013
- HANWA ELECTRONIC IND. CO., LTD.
- Toshiyuki Nakaie
- G01 - MEASURING TESTING
Information Patent Application
IMPULSE IMMUNITY TEST APPARATUS
- Publication number 20100090710
- Publication date Apr 15, 2010
- NEC Corporation
- Tsuneo Tsukagoshi
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHARACTERISTIC IMPEDANCE OF ELECTROSTATIC DISCH...
- Publication number 20080004820
- Publication date Jan 3, 2008
- HANWA ELECTRONIC IND. CO., LTD.
- Toshiyuki NAKAIE
- G01 - MEASURING TESTING