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Tracy Larabee
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Santa Cruz, CA, US
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last 30 patents
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Patent Grant
Method for diagnosing bridging faults in integrated circuits
Patent number
6,560,736
Issue date
May 6, 2003
The Regents of the University of California
F. Joel Ferguson
G01 - MEASURING TESTING
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Patent Grant
Method for diagnosing bridging faults in integrated circuits
Patent number
6,202,181
Issue date
Mar 13, 2001
The Regents of the University of California
F. Joel Ferguson
G01 - MEASURING TESTING